Woei Chen Peh

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
End-to-end quality of service management for memory device
- Patent number 12,131,073
- Issue date Oct 29, 2024
- Micron Technology, Inc.
- Muthazhagan Balasubramani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Runtime memory allocation to avoid and delay defect effects in memo...
- Patent number 11,762,567
- Issue date Sep 19, 2023
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating die block mapping after detected failure
- Patent number 11,630,727
- Issue date Apr 18, 2023
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data operation based on valid memory unit count
- Patent number 11,494,111
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Runtime memory allocation to avoid and delay defect effects in memo...
- Patent number 11,112,979
- Issue date Sep 7, 2021
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
END-TO-END QUALITY OF SERVICE MANAGEMENT FOR MEMORY DEVICE
- Publication number 20240094958
- Publication date Mar 21, 2024
- Micron Technology, Inc.
- Muthazhagan Balasubramani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
END-TO-END QUALITY OF SERVICE MANAGEMENT FOR MEMORY DEVICE
- Publication number 20230333776
- Publication date Oct 19, 2023
- Micron Technology, Inc.
- Muthazhagan Balasubramani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING DIE BLOCK MAPPING AFTER DETECTED FAILURE
- Publication number 20220308958
- Publication date Sep 29, 2022
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA OPERATION BASED ON VALID MEMORY UNIT COUNT
- Publication number 20220197535
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RUNTIME MEMORY ALLOCATION TO AVOID AND DELAY DEFECT EFFECTS IN MEMO...
- Publication number 20210365195
- Publication date Nov 25, 2021
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RUNTIME MEMORY ALLOCATION TO AVOID AND DELAY DEFECT EFFECTS IN MEMO...
- Publication number 20210026547
- Publication date Jan 28, 2021
- Micron Technology, Inc.
- Woei Chen Peh
- G06 - COMPUTING CALCULATING COUNTING