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Wojciech Jakub Poppe
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Via resistance analysis systems and methods
Patent number
9,496,853
Issue date
Nov 15, 2016
NVIDIA Corporation
Wojciech Jakub Poppe
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Determining on-chip voltage and temperature
Patent number
9,448,125
Issue date
Sep 20, 2016
NVIDIA Corporation
Abhishek Singh
G01 - MEASURING TESTING
Information
Patent Grant
Coupling resistance and capacitance analysis systems and methods
Patent number
9,425,772
Issue date
Aug 23, 2016
NVIDIA Corporation
Wojciech Jakub Poppe
G01 - MEASURING TESTING
Information
Patent Grant
System and method for examining asymetric operations
Patent number
8,952,705
Issue date
Feb 10, 2015
NVIDIA Corporation
Ilyas Elkin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR EXAMINING ASYMETRIC OPERATIONS
Publication number
20130106438
Publication date
May 2, 2013
NVIDIA Corporation
Ilyas Elkin
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR EXAMINING LEAKAGE IMPACTS
Publication number
20130106524
Publication date
May 2, 2013
NVIDIA Corporation
Ilyas Elkin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DETERMINING ON-CHIP VOLTAGE AND TEMPERATURE
Publication number
20130110437
Publication date
May 2, 2013
NVIDIA Corporation
Abhishek Singh
G01 - MEASURING TESTING
Information
Patent Application
COUPLING RESISTANCE AND CAPACITANCE ANALYSIS SYSTEMS AND METHODS
Publication number
20130027140
Publication date
Jan 31, 2013
NVIDIA Corporation
Wojciech Jakub Poppe
G01 - MEASURING TESTING
Information
Patent Application
VIA RESISTANCE ANALYSIS SYSTEMS AND METHODS
Publication number
20130021107
Publication date
Jan 24, 2013
NVIDIA Corporation
Wojciech Jakub Poppe
G01 - MEASURING TESTING