Wolfgang Alexander IFF

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Patents Grantslast 30 patents

Information Patent Grant
Method and a system for characterizing structures through a substrate
- Patent number 12,123,698
- Issue date Oct 22, 2024
- UNITY SEMICONDUCTOR
- Alain Courteville
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for characterising structures through a substrate
- Patent number 12,079,979
- Issue date Sep 3, 2024
- UNITY SEMICONDUCTOR
- Wolfgang Alexander Iff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and a system for characterising structures etched in a subst...
- Patent number 11,959,736
- Issue date Apr 16, 2024
- UNITY SEMICONDUCTOR
- Wolfgang Alexander Iff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and a system for combined characterisation of structures etc...
- Patent number 11,959,737
- Issue date Apr 16, 2024
- UNITY SEMICONDUCTOR
- Wolfgang Alexander Iff
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE
- Publication number 20240281955
- Publication date Aug 22, 2024
- Unity Semiconductor
- Wolfgang Alexander IFF
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES ETCHED IN A SUBST...
- Publication number 20230375332
- Publication date Nov 23, 2023
- Unity Semiconductor
- Wolfgang Alexander IFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE
- Publication number 20230377121
- Publication date Nov 23, 2023
- Unity Semiconductor
- Wolfgang Alexander IFF
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND A SYSTEM FOR COMBINED CHARACTERISATION OF STRUCTURES ETC...
- Publication number 20230375333
- Publication date Nov 23, 2023
- Unity Semiconductor
- Wolfgang Alexander IFF
- H01 - BASIC ELECTRIC ELEMENTS