Wolfgang Berger

Person

Gerstetten, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for tracking microscopic samples
- Patent number 11,328,896
- Issue date May 10, 2022
- Carl Zeiss Microscopy GmbH
- Wolfgang Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating a particle beam device
- Patent number 11,158,485
- Issue date Oct 26, 2021
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system and method of operating a particle beam system
- Patent number 11,092,702
- Issue date Aug 17, 2021
- Carl Zeiss Microscopy GmbH
- Jörg Fober
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam microscope
- Patent number 10,615,000
- Issue date Apr 7, 2020
- Carl Zeiss Microscopy GmbH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device for imaging an object and for imaging a structural u...
- Patent number 10,460,904
- Issue date Oct 29, 2019
- Carl Zeiss Microscopy GmbH
- Wolfgang Berger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing an object using a particle beam apparatus
- Patent number 9,535,020
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy GmbH
- Richard Schillinger
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam microscope for generating material data
- Patent number 8,766,219
- Issue date Jul 1, 2014
- Carl Zeiss Microscopy GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE BEAM SYSTEM
- Publication number 20230109124
- Publication date Apr 6, 2023
- CARL ZEISS MICROSCOPY GMBH
- Gero Walter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVIC...
- Publication number 20200388463
- Publication date Dec 10, 2020
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TRACKING MICROSCOPIC SAMPLES
- Publication number 20190341223
- Publication date Nov 7, 2019
- CARL ZEISS MICROSCOPY GMBH
- Wolfgang Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM MICROSCOPE
- Publication number 20190304742
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DEVICE FOR IMAGING AN OBJECT AND FOR IMAGING A STRUCTURAL U...
- Publication number 20180218877
- Publication date Aug 2, 2018
- CARL ZEISS MICROSCOPY GMBH
- Wolfgang Berger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS
- Publication number 20170038321
- Publication date Feb 9, 2017
- CARL ZEISS MICROSCOPY GMBH
- Richard Schillinger
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS
- Publication number 20160178543
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Richard Schillinger
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM MICROSCOPE FOR GENERATING MATERIAL DATA
- Publication number 20140070099
- Publication date Mar 13, 2014
- CARL ZEISS MICROSCOPY GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS

Wolfgang Berger

Person

Patents Grantslast 30 patents

Device and method for tracking microscopic samples

Operating a particle beam device

Particle beam system and method of operating a particle beam system

Electron beam microscope

Imaging device for imaging an object and for imaging a structural u...

Analyzing an object using a particle beam apparatus

Particle beam microscope for generating material data

Patents Applicationslast 30 patents

PARTICLE BEAM SYSTEM

METHOD FOR OPERATING A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVIC...

DEVICE AND METHOD FOR TRACKING MICROSCOPIC SAMPLES

ELECTRON BEAM MICROSCOPE

IMAGING DEVICE FOR IMAGING AN OBJECT AND FOR IMAGING A STRUCTURAL U...

ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS

ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUS

PARTICLE BEAM MICROSCOPE FOR GENERATING MATERIAL DATA