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Wolfgang Reinecke
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Zeuthen, DE
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last 30 patents
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Patent Grant
Reflective X-ray microscope and inspection system for examining obj...
Patent number
7,623,620
Issue date
Nov 24, 2009
Carl Zeiss SMT AG
Hans-Jürgen Mann
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Projection lens
Patent number
6,801,373
Issue date
Oct 5, 2004
Dr.-Ing. Wolfgang Reinecke Ingenieurburo fur Optik-Entwicklung
Wolfgang Reinecke
G02 - OPTICS
Information
Patent Grant
Projection objective
Patent number
6,795,255
Issue date
Sep 21, 2004
Optische Systeme Gottingen ISCO-Optic GmbH
Wolfgang Reinecke
G02 - OPTICS
Information
Patent Grant
Tuneable, adjustment-stable semiconductor laser light source and a...
Patent number
6,785,305
Issue date
Aug 31, 2004
Manfred Gabbert
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Reflective X-ray microscope and inspection system for examining obj...
Publication number
20050201514
Publication date
Sep 15, 2005
Hans-Jurgen Mann
B82 - NANO-TECHNOLOGY
Information
Patent Application
Projection lens
Publication number
20040105172
Publication date
Jun 3, 2004
Wolfgang Reinecke
G02 - OPTICS
Information
Patent Application
Projection objective
Publication number
20030112525
Publication date
Jun 19, 2003
Wolfgang Reinecke
G02 - OPTICS