Wolfgang Stadler

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Attachment member for semiconductor sensor device
- Patent number 8,093,689
- Issue date Jan 10, 2012
- Infineon Technologies AG
- Wolfgang Stadler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge test system and electrostatic discharge tes...
- Patent number 7,863,920
- Issue date Jan 4, 2011
- Infineon Technologies AG
- Reinhold Gaertner
- G01 - MEASURING TESTING
Information Patent Grant
Identification of ESD and latch-up weak points in an integrated cir...
- Patent number 7,694,247
- Issue date Apr 6, 2010
- Infineon Technologies AG
- Kai Esmark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit for protecting integrated circuits against electrostatic di...
- Patent number 7,359,169
- Issue date Apr 15, 2008
- Infineon Technologies AG
- Kai Esmark
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor structure integrated under a pad
- Patent number 7,190,077
- Issue date Mar 13, 2007
- Infineon Technologies AG
- Robert Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for testing the ESD resistance of a semiconductor...
- Patent number 7,009,404
- Issue date Mar 7, 2006
- Infineon Technologies AG
- Martin Wendel
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining an ESD/latch-up strength of an integrated ci...
- Patent number 6,930,501
- Issue date Aug 16, 2005
- Infineon Technologies AG
- Silke Bargstädt-Franke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating method for a semiconductor component
- Patent number 6,905,892
- Issue date Jun 14, 2005
- Infineon Technologies AG
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor with ESD protection
- Patent number 6,559,503
- Issue date May 6, 2003
- Infineon Technologies AG
- Martin Wendel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electrostatic Discharge Test System And Electrostatic Discharge Tes...
- Publication number 20090066354
- Publication date Mar 12, 2009
- INFINEON TECHNOLOGIES AG
- Reinhold Gaertner
- G01 - MEASURING TESTING
Information Patent Application
Attachment Member for Semiconductor Sensor Device
- Publication number 20090012439
- Publication date Jan 8, 2009
- INFINEON TECHNOLOGIES AG
- Wolfgang STADLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Esd test arrangement and method
- Publication number 20070165344
- Publication date Jul 19, 2007
- Infineon Technologies AG
- Kai Esmark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit for protecting integrated circuits against electrostatic di...
- Publication number 20060056121
- Publication date Mar 16, 2006
- Kai Esmark
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Method for producing a semiconductor circuit, and corresponding sem...
- Publication number 20050285199
- Publication date Dec 29, 2005
- Wolfgang Stadler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor structure integrated under a pad
- Publication number 20050242374
- Publication date Nov 3, 2005
- Robert Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for determining an ESD/latch-up strength of an integrated ci...
- Publication number 20050003564
- Publication date Jan 6, 2005
- Silke Bargstadt-Franke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Operating method for a semiconductor component
- Publication number 20030017676
- Publication date Jan 23, 2003
- Kai Esmark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for testing the ESD resistance of a semiconductor...
- Publication number 20030006776
- Publication date Jan 9, 2003
- Infineon Technologies AG, Germany
- Martin Wendel
- G01 - MEASURING TESTING
Information Patent Application
Transistor with ESD protection
- Publication number 20020093102
- Publication date Jul 18, 2002
- Martin Wendel
- H01 - BASIC ELECTRIC ELEMENTS

Wolfgang Stadler

Person

Patents Grantslast 30 patents

Attachment member for semiconductor sensor device

Electrostatic discharge test system and electrostatic discharge tes...

Identification of ESD and latch-up weak points in an integrated cir...

Circuit for protecting integrated circuits against electrostatic di...

Semiconductor structure integrated under a pad

Method and device for testing the ESD resistance of a semiconductor...

Method for determining an ESD/latch-up strength of an integrated ci...

Operating method for a semiconductor component

Transistor with ESD protection

Patents Applicationslast 30 patents

Electrostatic Discharge Test System And Electrostatic Discharge Tes...

Attachment Member for Semiconductor Sensor Device

Esd test arrangement and method

Circuit for protecting integrated circuits against electrostatic di...

Method for producing a semiconductor circuit, and corresponding sem...

Semiconductor structure integrated under a pad

Method for determining an ESD/latch-up strength of an integrated ci...

Operating method for a semiconductor component

Method and device for testing the ESD resistance of a semiconductor...

Transistor with ESD protection