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Wolfgang Studer
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Geisenheim, DE
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last 30 patents
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Patent Grant
X-ray system comprising an X-ray source, a detector assembly, and a...
Patent number
7,308,076
Issue date
Dec 11, 2007
Smiths Heimann GmbH
Wolfgang Studer
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
X-ray system comprising an x-ray source, a detector assembly, and a...
Publication number
20040134986
Publication date
Jul 15, 2004
Wolfgang Studer
G01 - MEASURING TESTING