Wolfgang Walter

Person

Kaufbeuren, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device test structures and methods
- Patent number 9,188,625
- Issue date Nov 17, 2015
- Infineon Technologies AG
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device comprising a fuse structure and a method for m...
- Patent number 9,165,828
- Issue date Oct 20, 2015
- Infineon Technologies AG
- Gabriele Bettineschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device test structures and methods
- Patent number 8,847,222
- Issue date Sep 30, 2014
- Infineon Technologies AG
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device comprising a fuse structure and a method for m...
- Patent number 8,659,118
- Issue date Feb 25, 2014
- Infineon Technologies AG
- Gabriele Bettineschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device test structures and methods
- Patent number 8,633,482
- Issue date Jan 21, 2014
- Infineon Technologies AG
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test structures and methods
- Patent number 7,858,406
- Issue date Dec 28, 2010
- Infineon Technologies AG
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test structures and methods
- Patent number 7,851,237
- Issue date Dec 14, 2010
- Infineon Technologies AG
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having a thermally shielded electric resistor trace
- Patent number 6,940,720
- Issue date Sep 6, 2005
- Infineon Technologies AG
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device Comprising a Fuse Structure and a Method for M...
- Publication number 20140127895
- Publication date May 8, 2014
- INFINEON TECHNOLOGIES AG
- Gabriele Bettineschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Test Structures and Methods
- Publication number 20140097864
- Publication date Apr 10, 2014
- INFINEON TECHNOLOGIES AG
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device and Method for Manufacturing a Semiconductor
- Publication number 20130026601
- Publication date Jan 31, 2013
- INFINEON TECHNOLOGIES AG
- Gabriele Bettineschi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device Test Structures and Methods
- Publication number 20110062442
- Publication date Mar 17, 2011
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device Test Structures and Methods
- Publication number 20110042671
- Publication date Feb 24, 2011
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test structures and methods
- Publication number 20080206908
- Publication date Aug 28, 2008
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test structures and methods
- Publication number 20080185584
- Publication date Aug 7, 2008
- Wolfgang Walter
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit having a thermally shielded electric resistor trace
- Publication number 20040011510
- Publication date Jan 22, 2004
- Armin Fischer
- H01 - BASIC ELECTRIC ELEMENTS

Wolfgang Walter

Person

Patents Grantslast 30 patents

Semiconductor device test structures and methods

Semiconductor device comprising a fuse structure and a method for m...

Semiconductor device test structures and methods

Semiconductor device comprising a fuse structure and a method for m...

Semiconductor device test structures and methods

Semiconductor device test structures and methods

Semiconductor device test structures and methods

Integrated circuit having a thermally shielded electric resistor trace

Patents Applicationslast 30 patents

Semiconductor Device Comprising a Fuse Structure and a Method for M...

Semiconductor Device Test Structures and Methods

Semiconductor Device and Method for Manufacturing a Semiconductor

Semiconductor Device Test Structures and Methods

Semiconductor Device Test Structures and Methods

Semiconductor device test structures and methods

Semiconductor device test structures and methods

Integrated circuit having a thermally shielded electric resistor trace