Won Gi Min

Person

Chandler, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Composite semiconductor device with different channel widths
- Patent number 9,601,614
- Issue date Mar 21, 2017
- NXP USA, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast programming antifuse and method of manufacture
- Patent number 9,589,967
- Issue date Mar 7, 2017
- NXP USA, INC.
- Won Gi Min
- G11 - INFORMATION STORAGE
Information Patent Grant
Resurf semiconductor device charge balancing
- Patent number 9,466,712
- Issue date Oct 11, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with HCI protection region
- Patent number 9,159,803
- Issue date Oct 13, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain-end drift diminution in semiconductor devices
- Patent number 9,136,323
- Issue date Sep 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RESURF semiconductor device charge balancing
- Patent number 9,041,103
- Issue date May 26, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with drain-end drift diminution
- Patent number 8,853,780
- Issue date Oct 7, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resurf semiconductor device charge balancing
- Patent number 8,389,366
- Issue date Mar 5, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming antifuses with curved breakdown regions
- Patent number 8,329,514
- Issue date Dec 11, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laterally diffused metal oxide semiconductor (LDMOS) device with mu...
- Patent number 8,319,283
- Issue date Nov 27, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuses with curved breakdown regions
- Patent number 8,049,299
- Issue date Nov 1, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse elements
- Patent number 7,834,417
- Issue date Nov 16, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Microelectronic assemblies with improved isolation voltage performance
- Patent number 7,795,702
- Issue date Sep 14, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual gate LDMOS devices
- Patent number 7,795,674
- Issue date Sep 14, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microelectronic assembly with improved isolation voltage performanc...
- Patent number 7,700,405
- Issue date Apr 20, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual gate LDMOS device fabrication methods
- Patent number 7,608,513
- Issue date Oct 27, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse element and method of manufacture
- Patent number 7,553,704
- Issue date Jun 30, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite capacitor and method for forming the same
- Patent number 7,411,270
- Issue date Aug 12, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse element and electrically redundant antifuse array for cont...
- Patent number 7,256,471
- Issue date Aug 14, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Composite Semiconductor Device with Different Channel Widths
- Publication number 20160284841
- Publication date Sep 29, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESURF SEMICONDUCTOR DEVICE CHARGE BALANCING
- Publication number 20150243781
- Publication date Aug 27, 2015
- FREESCALE SEMICONDUCTOR, INC.
- WON GI MIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST PROGRAMMING ANTIFUSE AND METHOD OF MANUFACTURE
- Publication number 20150206892
- Publication date Jul 23, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi MIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRAIN-END DRIFT DIMINUTION IN SEMICONDUCTOR DEVICES
- Publication number 20150004768
- Publication date Jan 1, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device with HCI Protection Region
- Publication number 20140054694
- Publication date Feb 27, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device with Drain-End Drift Diminution
- Publication number 20130292764
- Publication date Nov 7, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESURF SEMICONDUCTOR DEVICE CHARGE BALANCING
- Publication number 20130175616
- Publication date Jul 11, 2013
- FREESCALE SEMICONDUCTOR, INC.
- WON GI MIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING ANTIFUSES WITH CURVED BREAKDOWN REGIONS
- Publication number 20110312175
- Publication date Dec 22, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH MULTIPLE GATES AND DOPED REGIONS AND METH...
- Publication number 20100301403
- Publication date Dec 2, 2010
- WON GI MIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE
- Publication number 20100213570
- Publication date Aug 26, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTRONIC ASSEMBLIES WITH IMPROVED ISOLATION VOLTAGE PERFORMANCE
- Publication number 20100164056
- Publication date Jul 1, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL GATE LDMOS DEVICES
- Publication number 20100025765
- Publication date Feb 4, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESURF SEMICONDUCTOR DEVICE CHARGE BALANCING
- Publication number 20090294849
- Publication date Dec 3, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE ELEMENTS
- Publication number 20090224325
- Publication date Sep 10, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR OPERATING A MEMORY CIRCUIT
- Publication number 20080277756
- Publication date Nov 13, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTRONIC ASSEMBLY WITH IMPROVED ISOLATION VOLTAGE PERFORMANC...
- Publication number 20080203519
- Publication date Aug 28, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL GATE LDMOS DEVICE AND METHOD
- Publication number 20080182394
- Publication date Jul 31, 2008
- Hongning Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Composite capacitor and method for forming the same
- Publication number 20070228506
- Publication date Oct 4, 2007
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Antifuse element and method of manufacture
- Publication number 20060292754
- Publication date Dec 28, 2006
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Antifuse element and electrically redundant antifuse array for cont...
- Publication number 20060226509
- Publication date Oct 12, 2006
- Won Gi Min
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Composite semiconductor device with different channel widths

Fast programming antifuse and method of manufacture

Resurf semiconductor device charge balancing

Semiconductor device with HCI protection region

Drain-end drift diminution in semiconductor devices

RESURF semiconductor device charge balancing

Semiconductor device with drain-end drift diminution

Resurf semiconductor device charge balancing

Methods for forming antifuses with curved breakdown regions

Laterally diffused metal oxide semiconductor (LDMOS) device with mu...

Antifuses with curved breakdown regions

Antifuse elements

Microelectronic assemblies with improved isolation voltage performance

Dual gate LDMOS devices

Microelectronic assembly with improved isolation voltage performanc...

Dual gate LDMOS device fabrication methods

Antifuse element and method of manufacture

Composite capacitor and method for forming the same

Antifuse element and electrically redundant antifuse array for cont...

Patents Applicationslast 30 patents

Composite Semiconductor Device with Different Channel Widths

RESURF SEMICONDUCTOR DEVICE CHARGE BALANCING

FAST PROGRAMMING ANTIFUSE AND METHOD OF MANUFACTURE

DRAIN-END DRIFT DIMINUTION IN SEMICONDUCTOR DEVICES

Semiconductor Device with HCI Protection Region

Semiconductor Device with Drain-End Drift Diminution

RESURF SEMICONDUCTOR DEVICE CHARGE BALANCING

METHODS FOR FORMING ANTIFUSES WITH CURVED BREAKDOWN REGIONS

SEMICONDUCTOR DEVICE WITH MULTIPLE GATES AND DOPED REGIONS AND METH...

ANTIFUSE

MICROELECTRONIC ASSEMBLIES WITH IMPROVED ISOLATION VOLTAGE PERFORMANCE

DUAL GATE LDMOS DEVICES

RESURF SEMICONDUCTOR DEVICE CHARGE BALANCING

ANTIFUSE ELEMENTS

ELECTRONIC DEVICE AND METHOD FOR OPERATING A MEMORY CIRCUIT

MICROELECTRONIC ASSEMBLY WITH IMPROVED ISOLATION VOLTAGE PERFORMANC...

DUAL GATE LDMOS DEVICE AND METHOD

Composite capacitor and method for forming the same

Antifuse element and method of manufacture

Antifuse element and electrically redundant antifuse array for cont...