Won-Jae JANG

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Gyeonggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method to determine a patterning process parameter
- Patent number 11,300,883
- Issue date Apr 12, 2022
- ASML Netherlands B.V.
- Martin Jacobus Johan Jak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus and computer program
- Patent number 10,908,513
- Issue date Feb 2, 2021
- ASML Netherlands B.V.
- Marc Johannes Noot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method to Determine a Patterning Process Parameter
- Publication number 20190094703
- Publication date Mar 28, 2019
- ASML NETHERLANDS B.V.
- Martin Jacobus Johan JAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus and Computer Program
- Publication number 20190033727
- Publication date Jan 31, 2019
- ASML NETHERLANDS B.V.
- Marc Johannes NOOT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY