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Won Suk Ohm
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Seoul, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method of detecting defective electronic component
Patent number
12,111,234
Issue date
Oct 8, 2024
SAMSUNG ELECTRO-MECHANICS CO., LTD.
Heung Kil Park
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring moisture content of compressed r...
Patent number
10,386,293
Issue date
Aug 20, 2019
Balance Industry Co., Ltd.
Baik Yong Uhm
G01 - MEASURING TESTING
Information
Patent Grant
Method of estimating surface temperature of a diagnostic ultrasound...
Patent number
7,927,011
Issue date
Apr 19, 2011
Medison Co., Ltd.
Won Suk Ohm
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEVICE AND METHOD OF DETECTING DEFECT OF ELECTRONIC COMPONENT
Publication number
20230053343
Publication date
Feb 23, 2023
Samsung Electro-Mechanics Co., Ltd.
Heung Kil PARK
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING MOISTURE CONTENT OF COMPRESSED R...
Publication number
20170212035
Publication date
Jul 27, 2017
Balance Industry Co., Ltd.
Baik Yong UHM
G01 - MEASURING TESTING
Information
Patent Application
TWO-DIMENSIONAL VIRTUAL ARRAY PROBE FOR THREE-DIMENSIONAL ULTRASONI...
Publication number
20120210795
Publication date
Aug 23, 2012
ROBOGEN
Won-Suk OHM
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ESTIMATING SURFACE TEMPERATURE OF A DIAGNOSTIC ULTRASOUND...
Publication number
20080165825
Publication date
Jul 10, 2008
Medison Co., Ltd.
Won Suk Ohm
G01 - MEASURING TESTING