Wonshik Choi

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Seoul, KP

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Patents Grantslast 30 patents

Information Patent Grant
Single shot full-field reflection phase microscopy
- Patent number 10,451,402
- Issue date Oct 22, 2019
- Massachusetts Institute of Technology
- Zahid Yaqoob
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE-SHOT FULL-FIELD REFLECTION PHASE MICROSCOPY
- Publication number 20120307035
- Publication date Dec 6, 2012
- Zahid Yaqoob
- G02 - OPTICS