Wonshik Choi

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Somerville, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Distribution of refractive index measurement by synthetic aperture...
- Patent number 9,546,952
- Issue date Jan 17, 2017
- Massachusetts Institute of Technology
- Wonshik Choi
- G01 - MEASURING TESTING
Information Patent Grant
Tomographic phase microscopy
- Patent number 8,848,199
- Issue date Sep 30, 2014
- Massachusetts Institute of Technology
- Wonshik Choi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TOMOGRAPHIC PHASE MICROSCOPY
- Publication number 20150177133
- Publication date Jun 25, 2015
- Massachusetts Institute of Technology
- Wonshik Choi
- G01 - MEASURING TESTING
Information Patent Application
Tomographic phase microscopy
- Publication number 20090125242
- Publication date May 14, 2009
- Massachusetts Institute of Technology
- Wonshik Choi
- G01 - MEASURING TESTING