Woo Chul Cho

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Incheon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Non-contact type apparatus for testing open and short circuits of a...
- Patent number 7,746,086
- Issue date Jun 29, 2010
- Microinspection, Inc.
- Tak Eun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Noncontact type single side probe device and apparatus and method f...
- Publication number 20080018339
- Publication date Jan 24, 2008
- MICROINSPECTION, INC.
- Tak Eun
- G02 - OPTICS