Woo-Yoel Jeong

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor chip testing apparatus for picking up and testing a s...
- Patent number 9,664,706
- Issue date May 30, 2017
- SEMICORE INC.
- Duk-Soon Choi
- G01 - MEASURING TESTING
Information Patent Grant
Probe for inspecting electronic component
- Patent number 8,975,906
- Issue date Mar 10, 2015
- NTS Co., Ltd.
- Woo-Yoel Jeong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PIN
- Publication number 20240288470
- Publication date Aug 29, 2024
- AWESOMENICS INC.
- Woo Yoel JEONG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHIP TESTING APPARATUS
- Publication number 20160154023
- Publication date Jun 2, 2016
- Amkor Technology Korea, Inc.
- Duk-Soon CHOI
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR INSPECTING ELECTRONIC COMPONENT
- Publication number 20130069684
- Publication date Mar 21, 2013
- NTS CO., LTD.
- Woo-Yoel Jeong
- G01 - MEASURING TESTING