Wookrae Kim

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 12,228,499
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,222,282
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Seoyeon Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Digital holography microscope (DHM), and inspection method and semi...
- Patent number 12,045,009
- Issue date Jul 23, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G02 - OPTICS
Information Patent Grant
Metrology apparatus and method based on diffraction using oblique i...
- Patent number 12,002,698
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging ellipsometry (IE)-based inspection method and method of fab...
- Patent number 11,972,960
- Issue date Apr 30, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-scale spectral imaging apparatuses and methods, and methods o...
- Patent number 11,726,046
- Issue date Aug 15, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system capable of adjusting AOI, AOI spread and azimuth...
- Patent number 11,624,699
- Issue date Apr 11, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 11,604,136
- Issue date Mar 14, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G02 - OPTICS
Information Patent Grant
Digital holography microscope (DHM), and inspection method and semi...
- Patent number 11,314,205
- Issue date Apr 26, 2022
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G02 - OPTICS
Information Patent Grant
Wafer inspection apparatus
- Patent number 11,264,256
- Issue date Mar 1, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and semiconductor structure-manufacturing appa...
- Patent number 10,699,927
- Issue date Jun 30, 2020
- Samsung Electronics Co., Ltd.
- Wookrae Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20250052667
- Publication date Feb 13, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Jooyoun KANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20250012556
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Younguk Jin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240288265
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- Jinyong Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS
- Publication number 20240272561
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Junho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240219315
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Jangwoon Sung
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE MICROSCOPY METROLOGY SYSTEM AND METHOD OF OPERATING FL...
- Publication number 20240212122
- Publication date Jun 27, 2024
- Samsung Electronics Co., Ltd.
- Namyoon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230400404
- Publication date Dec 14, 2023
- Samsung Electronics Co., Ltd.
- Garam Choi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230375463
- Publication date Nov 23, 2023
- Samsung Electronics Co., Ltd.
- Seoyeon JEONG
- G02 - OPTICS
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20230204493
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230186460
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230114817
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Inho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Digital Holography Microscope (DHM), and Inspection Method and Semi...
- Publication number 20220276607
- Publication date Sep 1, 2022
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-SCALE SPECTRAL IMAGING APPARATUSES AND METHODS, AND METHODS O...
- Publication number 20220074867
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20220074848
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD BASED ON DIFFRACTION USING OBLIQUE I...
- Publication number 20220005715
- Publication date Jan 6, 2022
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM CAPABLE OF ADJUSTING AOI, AOI SPREAD AND AZIMUTH...
- Publication number 20210364420
- Publication date Nov 25, 2021
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS
- Publication number 20210082725
- Publication date Mar 18, 2021
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING ELLIPSOMETRY (IE)-BASED INSPECTION METHOD AND METHOD OF FAB...
- Publication number 20210028035
- Publication date Jan 28, 2021
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND SEMICONDUCTOR STRUCTURE-MANUFACTURING APPA...
- Publication number 20200185240
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Wookrae KIM
- G01 - MEASURING TESTING
Information Patent Application
Digital Holography Microscope (DHM), and Inspection Method and Semi...
- Publication number 20190369557
- Publication date Dec 5, 2019
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Wookrae Kim

Person

Patents Grantslast 30 patents

Pupil ellipsometry measurement apparatus and method and method of f...

Semiconductor measurement apparatus

Digital holography microscope (DHM), and inspection method and semi...

Metrology apparatus and method based on diffraction using oblique i...

Imaging ellipsometry (IE)-based inspection method and method of fab...

Multi-scale spectral imaging apparatuses and methods, and methods o...

Measurement system capable of adjusting AOI, AOI spread and azimuth...

Pupil ellipsometry measurement apparatus and method and method of f...

Digital holography microscope (DHM), and inspection method and semi...

Wafer inspection apparatus

Inspection apparatus and semiconductor structure-manufacturing appa...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

FLUORESCENCE MICROSCOPY METROLOGY SYSTEM AND METHOD OF OPERATING FL...

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

Digital Holography Microscope (DHM), and Inspection Method and Semi...

MULTI-SCALE SPECTRAL IMAGING APPARATUSES AND METHODS, AND METHODS O...

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

METROLOGY APPARATUS AND METHOD BASED ON DIFFRACTION USING OBLIQUE I...

MEASUREMENT SYSTEM CAPABLE OF ADJUSTING AOI, AOI SPREAD AND AZIMUTH...

WAFER INSPECTION APPARATUS

IMAGING ELLIPSOMETRY (IE)-BASED INSPECTION METHOD AND METHOD OF FAB...

INSPECTION APPARATUS AND SEMICONDUCTOR STRUCTURE-MANUFACTURING APPA...

Digital Holography Microscope (DHM), and Inspection Method and Semi...