Woon-sup Choi

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test board, test equipment, test system, and test method
- Patent number 10,203,369
- Issue date Feb 12, 2019
- Samsung Electronics Co., Ltd.
- Joo-sung Yun
- G01 - MEASURING TESTING
Information Patent Grant
Test board for semiconductor package, test system, and method of ma...
- Patent number 10,088,521
- Issue date Oct 2, 2018
- Samsung Electronics Co., Ltd.
- Joo-sung Yun
- G01 - MEASURING TESTING
Information Patent Grant
Signal capture system and test apparatus including the same
- Patent number 8,476,908
- Issue date Jul 2, 2013
- Samsung Electronics Co., Ltd.
- Woon-sup Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Field mounting-type test apparatus and method for testing memory co...
- Patent number 8,103,927
- Issue date Jan 24, 2012
- Samsung Electronics Co., Ltd.
- In-ho Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 7,816,937
- Issue date Oct 19, 2010
- Samsung Electronics Co., Ltd.
- Young-Ki Kwak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST BOARD FOR SEMICONDUCTOR PACKAGE, TEST SYSTEM, AND METHOD OF MA...
- Publication number 20180031629
- Publication date Feb 1, 2018
- Samsung Electronics Co., Ltd.
- Joo-sung YUN
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD
- Publication number 20170023638
- Publication date Jan 26, 2017
- Joo-sung YUN
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME
- Publication number 20110109318
- Publication date May 12, 2011
- Samsung Electronics Co., Ltd.
- Woon-sup Choi
- G11 - INFORMATION STORAGE
Information Patent Application
Field mounting-type test apparatus and method for testing memory co...
- Publication number 20090300442
- Publication date Dec 3, 2009
- Samsung Electronics Co.
- In-ho Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING AN OBJECT
- Publication number 20090015287
- Publication date Jan 15, 2009
- YOUNG-KI KWAK
- G01 - MEASURING TESTING