WU CHENG-HUNG

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Patents Grantslast 30 patents

Information Patent Grant
Detection of defects on wafer during semiconductor fabrication
- Patent number 9,466,101
- Issue date Oct 11, 2016
- Taiwan Semiconductor Manufacturing Company Limited
- Chun-Hsien Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF DEFECTS ON WAFER DURING SEMICONDUCTOR FABRICATION
- Publication number 20140328534
- Publication date Nov 6, 2014
- Taiwan Semiconductor Manufacturing Company Limited
- CHUN-HSIEN LIN
- G06 - COMPUTING CALCULATING COUNTING