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Lake Oswego, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Machine learning-based adjustments in volume diagnosis procedures f...
Patent number
12,001,973
Issue date
Jun 4, 2024
SIEMENS INDUSTRY SOFTWARE INC.
Gaurav Veda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Input data compression for machine learning-based chain diagnosis
Patent number
11,681,843
Issue date
Jun 20, 2023
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Library cell modeling for transistor-level test pattern generation
Patent number
11,635,462
Issue date
Apr 25, 2023
SIEMENS INDUSTRY SOFTWARE INC.
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Bidirectional scan cells for single-path reversible scan chains
Patent number
11,408,938
Issue date
Aug 9, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Multi-stage machine learning-based chain diagnosis
Patent number
11,361,248
Issue date
Jun 14, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programmable test compactor for improving defect determination
Patent number
11,320,487
Issue date
May 3, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Reversible multi-bit scan cell-based scan chains for improving chai...
Patent number
11,156,661
Issue date
Oct 26, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic resolution enhancement with reversible scan chains
Patent number
11,106,848
Issue date
Aug 31, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chain testing and diagnosis using two-dimensional scan architecture
Patent number
11,092,645
Issue date
Aug 17, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Low pin count reversible scan architecture
Patent number
11,073,556
Issue date
Jul 27, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimized scan chain diagnostic pattern generation for reversible s...
Patent number
11,041,906
Issue date
Jun 22, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Prediction of test pattern counts for scan configuration determination
Patent number
11,010,523
Issue date
May 18, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deterministic test pattern generation for designs with timing excep...
Patent number
10,977,400
Issue date
Apr 13, 2021
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cell-aware diagnostic pattern generation for logic diagnosis
Patent number
10,795,751
Issue date
Oct 6, 2020
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cell-aware root cause deconvolution for defect diagnosis and yield...
Patent number
10,592,625
Issue date
Mar 17, 2020
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generating root cause candidates for yield analysis
Patent number
10,496,779
Issue date
Dec 3, 2019
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan cell selection for partial scan designs
Patent number
10,372,855
Issue date
Aug 6, 2019
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wide-range clock signal generation for speed grading of logic cores
Patent number
10,317,462
Issue date
Jun 11, 2019
Mentor Graphics Corporation
Shi-Yu Huang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit defect diagnosis based on sink cell fault models
Patent number
10,234,502
Issue date
Mar 19, 2019
Mentor Graphics Corporation
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Grant
Transition test generation for detecting cell internal defects
Patent number
10,222,420
Issue date
Mar 5, 2019
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-stage test response compactors
Patent number
10,120,024
Issue date
Nov 6, 2018
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Generating test sets for diagnosing scan chain failures
Patent number
9,977,080
Issue date
May 22, 2018
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING
Information
Patent Grant
Channel sharing for testing circuits having non-identical cores
Patent number
9,915,702
Issue date
Mar 13, 2018
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic design partitioning for diagnosis
Patent number
9,857,421
Issue date
Jan 2, 2018
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-stage test response compactors
Patent number
9,778,316
Issue date
Oct 3, 2017
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit of pulse-vanishing test
Patent number
9,720,038
Issue date
Aug 1, 2017
Mentor Graphics, A Siemens Business
Shi-Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Test access architecture for stacked memory and logic dies
Patent number
9,689,918
Issue date
Jun 27, 2017
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Expanded canonical forms of layout patterns
Patent number
9,626,474
Issue date
Apr 18, 2017
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Identification of power sensitive scan cells
Patent number
9,501,589
Issue date
Nov 22, 2016
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Generating root cause candidates for yield analysis
Patent number
9,443,051
Issue date
Sep 13, 2016
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DEFECT DIAGNOSIS WITH DYNAMIC ROOT CAUSE DETECTION
Publication number
20240070371
Publication date
Feb 29, 2024
Siemens Industry Software Inc.
Xiaoyuan Qi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIBRARY CELL MODELING FOR TRANSISTOR-LEVEL TEST PATTERN GENERATION
Publication number
20220065929
Publication date
Mar 3, 2022
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Application
BIDIRECTIONAL SCAN CELLS FOR SINGLE-PATH REVERSIBLE SCAN CHAINS
Publication number
20220043062
Publication date
Feb 10, 2022
Siemens Industry Software Inc.
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC RESOLUTION ENHANCEMENT WITH REVERSIBLE SCAN CHAINS
Publication number
20210150111
Publication date
May 20, 2021
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Application
Reversible Multi-Bit Scan Cell-based Scan Chains For Improving Chai...
Publication number
20210033669
Publication date
Feb 4, 2021
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Application
DETERMINISTIC TEST PATTERN GENERATION FOR DESIGNS WITH TIMING EXCEP...
Publication number
20200410065
Publication date
Dec 31, 2020
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Low Pin Count Reversible Scan Architecture
Publication number
20200341057
Publication date
Oct 29, 2020
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Optimized Scan Chain Diagnostic Pattern Generation for Reversible S...
Publication number
20200333398
Publication date
Oct 22, 2020
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
MACHINE LEARNING-BASED ADJUSTMENTS IN VOLUME DIAGNOSIS PROCEDURES F...
Publication number
20200302321
Publication date
Sep 24, 2020
Mentor Graphics Corporation
Gaurav Veda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Chain Testing And Diagnosis Using Two-Dimensional Scan Architecture
Publication number
20200166571
Publication date
May 28, 2020
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Application
Deep Learning Based Test Compression Analyzer
Publication number
20190311290
Publication date
Oct 10, 2019
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multi-Stage Machine Learning-Based Chain Diagnosis
Publication number
20190220776
Publication date
Jul 18, 2019
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Input Data Compression For Machine Learning-Based Chain Diagnosis
Publication number
20190220745
Publication date
Jul 18, 2019
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Cell-Aware Diagnostic Pattern Generation For Logic Diagnosis
Publication number
20180253346
Publication date
Sep 6, 2018
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Counter-Based Scan Chain Diagnosis
Publication number
20180217204
Publication date
Aug 2, 2018
Mentor Graphics Corporation
Yu Huang
G11 - INFORMATION STORAGE
Information
Patent Application
MULTI-STAGE TEST RESPONSE COMPACTORS
Publication number
20180156867
Publication date
Jun 7, 2018
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
Wide-Range Clock Signal Generation For Speed Grading Of Logic Cores
Publication number
20170328952
Publication date
Nov 16, 2017
Mentor Graphics Corporation
Shi-Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
TRANSITION TEST GENERATION FOR DETECTING CELL INTERNAL DEFECTS
Publication number
20170193155
Publication date
Jul 6, 2017
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GENERATING ROOT CAUSE CANDIDATES FOR YIELD ANALYSIS
Publication number
20170103158
Publication date
Apr 13, 2017
Mentor Graphics Corporation
Robert Brady Benware
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTI-STAGE TEST RESPONSE COMPACTORS
Publication number
20160320450
Publication date
Nov 3, 2016
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC DESIGN PARTITIONING FOR DIAGNOSIS
Publication number
20160245866
Publication date
Aug 25, 2016
Mentor Graphics Corporation
Huaxing Tang
G01 - MEASURING TESTING
Information
Patent Application
Expanded Canonical Forms Of Layout Patterns
Publication number
20150302137
Publication date
Oct 22, 2015
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan Cell Selection For Partial Scan Designs
Publication number
20150248515
Publication date
Sep 3, 2015
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Cell Internal Defect Diagnosis
Publication number
20150234978
Publication date
Aug 20, 2015
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GENERATING TEST SETS FOR DIAGNOSING SCAN CHAIN FAILURES
Publication number
20150226796
Publication date
Aug 13, 2015
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING
Information
Patent Application
Channel Sharing For Testing Circuits Having Non-Identical Cores
Publication number
20150149847
Publication date
May 28, 2015
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
Canonical Forms Of Layout Patterns
Publication number
20150135151
Publication date
May 14, 2015
Mentor Graphics Corporation
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPEEDING UP DEFECT DIAGNOSIS TECHNIQUES
Publication number
20150135030
Publication date
May 14, 2015
Mentor Graphics Corporation
Wei Zou
G01 - MEASURING TESTING
Information
Patent Application
IDENTIFICATION OF POWER SENSITIVE SCAN CELLS
Publication number
20150040087
Publication date
Feb 5, 2015
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Application
Method and Circuit Of Pulse-Vanishing Test
Publication number
20140347088
Publication date
Nov 27, 2014
Mentor Graphics Corporation
Shi-Yu Huang
G01 - MEASURING TESTING