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last 30 patents
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Patent Grant
Integrated circuit having a scan chain and testing method for a chip
Patent number
8,438,439
Issue date
May 7, 2013
Actions Semiconductor Co., Ltd.
Wuhong Xie
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
INTEGRATED CIRCUIT HAVING A SCAN CHAIN AND TESTING METHOD FOR A CHIP
Publication number
20120124437
Publication date
May 17, 2012
ACTIONS SEMICONDUCTOR CO., LTD.
Wuhong XIE
G01 - MEASURING TESTING