Wui Fung SZE

Person

Kwai Chung, HK

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for imaging lens alignment using a virtual tes...
- Patent number 11,695,915
- Issue date Jul 4, 2023
- ASMPT SINGAPORE PTE. LTD.
- Wui Fung Sze
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method inspecting bonded semiconductor dice
- Patent number 11,011,435
- Issue date May 18, 2021
- ASM Technology Singapore Pte. Ltd.
- Wui Fung Sze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-precision bond head positioning method and apparatus
- Patent number 10,861,819
- Issue date Dec 8, 2020
- ASM Technology Singapore Pte. Ltd.
- Jiangwen Deng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Confocal imaging of an object utilising a pinhole array
- Patent number 10,852,519
- Issue date Dec 1, 2020
- ASM Technology Singapore Pte. Ltd.
- Wui Fung Sze
- G02 - OPTICS
Information Patent Grant
Apparatus and method for reconstructing a three-dimensional profile...
- Patent number 10,659,699
- Issue date May 19, 2020
- ASM Technology Singapore Pte. Ltd.
- Jiangwen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vertical chromatic confocal scanning method and system
- Patent number 10,197,781
- Issue date Feb 5, 2019
- ASM Technology Singapore Pte. Ltd.
- Jiangwen Deng
- G02 - OPTICS
Information Patent Grant
Three-dimensional imaging using a multi-phase projector
- Patent number 10,036,630
- Issue date Jul 31, 2018
- ASM Technology Singapore Pte. Ltd.
- Wui Fung Sze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chromatic confocal scanning apparatus
- Patent number 8,654,352
- Issue date Feb 18, 2014
- ASM Technology Singapore Pte. Ltd.
- Jiangwen Deng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD INSPECTING BONDED SEMICONDUCTOR DICE
- Publication number 20200161193
- Publication date May 21, 2020
- ASM Technology Singapore Pte Ltd
- Wui Fung SZE
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL CHROMATIC CONFOCAL SCANNING METHOD AND SYSTEM
- Publication number 20180188515
- Publication date Jul 5, 2018
- ASM Technology Singapore Pte Ltd
- Jiangwen DENG
- G02 - OPTICS
Information Patent Application
CONFOCAL IMAGING OF AN OBJECT UTILISING A PINHOLE ARRAY
- Publication number 20180149848
- Publication date May 31, 2018
- Wui Fung SZE
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR RECONSTRUCTING A THREE-DIMENSIONAL PROFILE...
- Publication number 20160014315
- Publication date Jan 14, 2016
- Jiangwen DENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHROMATIC CONFOCAL SCANNING APPARATUS
- Publication number 20140043619
- Publication date Feb 13, 2014
- Jiangwen DENG
- G01 - MEASURING TESTING

Wui Fung SZE

Person

Patents Grantslast 30 patents

Apparatus and method for imaging lens alignment using a virtual tes...

Apparatus and method inspecting bonded semiconductor dice

High-precision bond head positioning method and apparatus

Confocal imaging of an object utilising a pinhole array

Apparatus and method for reconstructing a three-dimensional profile...

Vertical chromatic confocal scanning method and system

Three-dimensional imaging using a multi-phase projector

Chromatic confocal scanning apparatus

Patents Applicationslast 30 patents

APPARATUS AND METHOD INSPECTING BONDED SEMICONDUCTOR DICE

VERTICAL CHROMATIC CONFOCAL SCANNING METHOD AND SYSTEM

CONFOCAL IMAGING OF AN OBJECT UTILISING A PINHOLE ARRAY

APPARATUS AND METHOD FOR RECONSTRUCTING A THREE-DIMENSIONAL PROFILE...

CHROMATIC CONFOCAL SCANNING APPARATUS