Wun Wah Edmond Chan

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Shenzhen, CN

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Patents Grantslast 30 patents

Information Patent Grant
Defect prediction method and apparatus
- Patent number 10,068,176
- Issue date Sep 4, 2018
- Huawei Technologies Co., Ltd.
- Wun Wah Edmond Chan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT PREDICTION METHOD AND APPARATUS
- Publication number 20150112903
- Publication date Apr 23, 2015
- Huawei Technologies Co., Ltd
- Wun Wah Edmond Chan
- G06 - COMPUTING CALCULATING COUNTING