WUN-YE KU

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TAOYUAN CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system method
- Patent number 12,211,200
- Issue date Jan 28, 2025
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection system
- Patent number 12,148,144
- Issue date Nov 19, 2024
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic system and method of specimen qualification
- Patent number 12,019,032
- Issue date Jun 25, 2024
- NANYA TECHNOLOGY CORPORATION
- Hung-Chih Chang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer test system and methods thereof
- Patent number 11,486,899
- Issue date Nov 1, 2022
- NANYA TECHNOLOGY CORPORATION
- Chia-Lin Tsai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC SYSTEM OF SPECIMEN QUALIFICATION
- Publication number 20240295505
- Publication date Sep 5, 2024
- NANYA TECHNOLOGY CORPORATION
- Hung-Chih CHANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM METHOD
- Publication number 20230334648
- Publication date Oct 19, 2023
- NANYA TECHNOLOGY CORPORATION
- CHIA-LIN TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20230334647
- Publication date Oct 19, 2023
- NANYA TECHNOLOGY CORPORATION
- CHIA-LIN TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC SYSTEM AND METHOD OF SPECIMEN QUALIFICATION
- Publication number 20220178845
- Publication date Jun 9, 2022
- NANYA TECHNOLOGY CORPORATION
- Hung-Chih CHANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND METHODS THEREOF
- Publication number 20210239736
- Publication date Aug 5, 2021
- NANYA TECHNOLOGY CORPORATION
- CHIA-LIN TSAI
- G01 - MEASURING TESTING