Xavier Colonna de Lega

Person

Middlefield, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Calibration of scanning interferometers
- Patent number 9,958,254
- Issue date May 1, 2018
- Zygo Corporation
- Peter J. de Groot
- G02 - OPTICS
Information Patent Grant
Interferometer with real-time fringe-free imaging
- Patent number 9,719,777
- Issue date Aug 1, 2017
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining information about a transparent o...
- Patent number 9,658,129
- Issue date May 23, 2017
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Optical evaluation of lenses and lens molds
- Patent number 9,599,534
- Issue date Mar 21, 2017
- Zygo Corporation
- Martin F. Fay
- G01 - MEASURING TESTING
Information Patent Grant
Surface topography interferometer with surface color
- Patent number 9,541,381
- Issue date Jan 10, 2017
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for lateral metrology
- Patent number 9,025,162
- Issue date May 5, 2015
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence interferometry with scan error correction
- Patent number 8,902,431
- Issue date Dec 2, 2014
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric methods for metrology of surfaces, films and underr...
- Patent number 8,854,628
- Issue date Oct 7, 2014
- Zygo Corporation
- Xavier M. Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Object thickness and surface profile measurements
- Patent number 8,698,891
- Issue date Apr 15, 2014
- Zygo Corporation
- Justin Turner
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact surface characterization using modulated illumination
- Patent number 8,649,024
- Issue date Feb 11, 2014
- Zygo Corporation
- Xavier M. Colonna de Lega
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometric systems and methods featuring spectral analysis of...
- Patent number 8,120,781
- Issue date Feb 21, 2012
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Scan error correction in low coherence scanning interferometry
- Patent number 8,004,688
- Issue date Aug 23, 2011
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring characteristics of surface features
- Patent number 7,924,435
- Issue date Apr 12, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometry for thin film thickness and surface measure...
- Patent number 7,468,799
- Issue date Dec 23, 2008
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION OF SCANNING INTERFEROMETERS
- Publication number 20160047645
- Publication date Feb 18, 2016
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EVALUATION OF LENSES AND LENS MOLDS
- Publication number 20160047711
- Publication date Feb 18, 2016
- Zygo Corporation
- Martin F. Fay
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EVALUATION OF LENSES AND LENS MOLDS
- Publication number 20160047712
- Publication date Feb 18, 2016
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TOPOGRAPHY INTERFEROMETER WITH SURFACE COLOR
- Publication number 20140226150
- Publication date Aug 14, 2014
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION
- Publication number 20130155413
- Publication date Jun 20, 2013
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
OBJECT THICKNESS AND SURFACE PROFILE MEASUREMENTS
- Publication number 20120229621
- Publication date Sep 13, 2012
- Zygo Corporation
- Justin Turner
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRU...
- Publication number 20120224183
- Publication date Sep 6, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT SURFACE CHARACTERIZATION USING MODULATED ILLUMINATION
- Publication number 20120140243
- Publication date Jun 7, 2012
- Zygo Corporation
- Xavier M. Colonna de Lega
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...
- Publication number 20120089365
- Publication date Apr 12, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERR...
- Publication number 20120069326
- Publication date Mar 22, 2012
- Zygo Corporation
- Xavier M. Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR DETERMINING OVERLAY ERRORS
- Publication number 20110032535
- Publication date Feb 10, 2011
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND REFERENCE INTERFEROMETER
- Publication number 20100128276
- Publication date May 27, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
SCAN ERROR CORRECTION IN LOW COHERENCE SCANNING INTERFEROMETRY
- Publication number 20100128280
- Publication date May 27, 2010
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR LATERAL METROLOGY
- Publication number 20090303493
- Publication date Dec 10, 2009
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR OVERLAY MEASUREMENTS
- Publication number 20090262362
- Publication date Oct 22, 2009
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
SCANNING INTERFEROMETRY FOR THIN FILM THICKNESS AND SURFACE MEASURE...
- Publication number 20080180694
- Publication date Jul 31, 2008
- Zygo Corporation
- Peter J. de Groot
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF SURFACE FEATURES
- Publication number 20080174784
- Publication date Jul 24, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer with multiple modes of operation for determining cha...
- Publication number 20060158658
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for determining characteristics of an object surface
- Publication number 20060158659
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Low coherence grazing incidence interferometry systems and methods
- Publication number 20050057757
- Publication date Mar 17, 2005
- Xavier Colonna De Lega
- G01 - MEASURING TESTING

Xavier Colonna de Lega

Person

Patents Grantslast 30 patents

Calibration of scanning interferometers

Interferometer with real-time fringe-free imaging

Method and system for determining information about a transparent o...

Optical evaluation of lenses and lens molds

Surface topography interferometer with surface color

Interferometry for lateral metrology

Low coherence interferometry with scan error correction

Interferometric methods for metrology of surfaces, films and underr...

Object thickness and surface profile measurements

Non-contact surface characterization using modulated illumination

Interferometric systems and methods featuring spectral analysis of...

Scan error correction in low coherence scanning interferometry

Apparatus and method for measuring characteristics of surface features

Scanning interferometry for thin film thickness and surface measure...

Patents Applicationslast 30 patents

CALIBRATION OF SCANNING INTERFEROMETERS

OPTICAL EVALUATION OF LENSES AND LENS MOLDS

OPTICAL EVALUATION OF LENSES AND LENS MOLDS

SURFACE TOPOGRAPHY INTERFEROMETER WITH SURFACE COLOR

LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION

OBJECT THICKNESS AND SURFACE PROFILE MEASUREMENTS

INTERFEROMETRIC METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRU...

NON-CONTACT SURFACE CHARACTERIZATION USING MODULATED ILLUMINATION

DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...

INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERR...

INTERFEROMETER FOR DETERMINING OVERLAY ERRORS

COMPOUND REFERENCE INTERFEROMETER

SCAN ERROR CORRECTION IN LOW COHERENCE SCANNING INTERFEROMETRY

INTERFEROMETRY FOR LATERAL METROLOGY

INTERFEROMETER FOR OVERLAY MEASUREMENTS

SCANNING INTERFEROMETRY FOR THIN FILM THICKNESS AND SURFACE MEASURE...

APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF SURFACE FEATURES

Interferometer with multiple modes of operation for determining cha...

Interferometer for determining characteristics of an object surface

Low coherence grazing incidence interferometry systems and methods