Xavier Colonna De Lega

Person

Middletown, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fiber-based interferometer system for monitoring an imaging interfe...
- Patent number 8,379,218
- Issue date Feb 19, 2013
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for overlay measurements
- Patent number 8,248,617
- Issue date Aug 21, 2012
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining overlay errors
- Patent number 8,189,202
- Issue date May 29, 2012
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing surface structure using scanning interferometry
- Patent number 8,126,677
- Issue date Feb 28, 2012
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer utilizing polarization scanning
- Patent number 7,978,337
- Issue date Jul 12, 2011
- Zygo Corporation
- Peter De Groot
- G02 - OPTICS
Information Patent Grant
Compound reference interferometer
- Patent number 7,978,338
- Issue date Jul 12, 2011
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,952,724
- Issue date May 31, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,948,636
- Issue date May 24, 2011
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for lateral metrology
- Patent number 7,889,355
- Issue date Feb 15, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for determining characteristics of an object surface...
- Patent number 7,884,947
- Issue date Feb 8, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,684,049
- Issue date Mar 23, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry method and system including spectral decomposition
- Patent number 7,636,168
- Issue date Dec 22, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Generating model signals for interferometry
- Patent number 7,619,746
- Issue date Nov 17, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,616,323
- Issue date Nov 10, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using scanning interferometry
- Patent number 7,466,429
- Issue date Dec 16, 2008
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining characteristics of an object surface
- Patent number 7,446,882
- Issue date Nov 4, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining characteristics of an object surface...
- Patent number 7,428,057
- Issue date Sep 23, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometry for thin film thickness and surface measure...
- Patent number 7,324,210
- Issue date Jan 29, 2008
- Zygo Corporation
- Peter J De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,324,214
- Issue date Jan 29, 2008
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining optical properties using low-co...
- Patent number 7,304,747
- Issue date Dec 4, 2007
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Triangulation methods and systems for profiling surfaces through a...
- Patent number 7,292,346
- Issue date Nov 6, 2007
- Zygo Corporation
- Peter J De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence grazing incidence interferometry for profiling and ti...
- Patent number 7,289,224
- Issue date Oct 30, 2007
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using scanning interferometry
- Patent number 7,271,918
- Issue date Sep 18, 2007
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using height scanning interfer...
- Patent number 7,239,398
- Issue date Jul 3, 2007
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric microscopy using reflective optics for complex surf...
- Patent number 7,212,291
- Issue date May 1, 2007
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining optical properties using low-co...
- Patent number 7,142,311
- Issue date Nov 28, 2006
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of complex surface shapes using a spherical wavefront
- Patent number 7,126,698
- Issue date Oct 24, 2006
- Zygo Corporation
- Peter J De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using scanning interferometry
- Patent number 7,106,454
- Issue date Sep 12, 2006
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interferometry
- Patent number 7,102,761
- Issue date Sep 5, 2006
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer having a coupled cavity geometry for use with an ext...
- Patent number 7,046,371
- Issue date May 16, 2006
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20100265516
- Publication date Oct 21, 2010
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...
- Publication number 20100134786
- Publication date Jun 3, 2010
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
FIBER-BASED INTERFEROMETER SYSTEM FOR MONITORING AN IMAGING INTERFE...
- Publication number 20100128278
- Publication date May 27, 2010
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEMS AND METHODS FEATURING SPECTRAL ANALYSIS OF...
- Publication number 20100128283
- Publication date May 27, 2010
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING SURFACE STRUCTURE USING SCANNING INTERFEROMETRY
- Publication number 20090182528
- Publication date Jul 16, 2009
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER UTILIZING POLARIZATION SCANNING
- Publication number 20090128827
- Publication date May 21, 2009
- Peter de Groot
- G02 - OPTICS
Information Patent Application
GENERATING MODEL SIGNALS FOR INTERFEROMETRY
- Publication number 20090021723
- Publication date Jan 22, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING OPTICAL PROPERTIS USING LOW COH...
- Publication number 20080278730
- Publication date Nov 13, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR LATERAL METROLOGY
- Publication number 20080180685
- Publication date Jul 31, 2008
- Zygo Corporation
- XAVIER COLONNA DE LEGA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...
- Publication number 20080088849
- Publication date Apr 17, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
PROFILING COMPLEX SURFACE STRUCTURES USING SCANNING INTERFEROMETRY
- Publication number 20080065350
- Publication date Mar 13, 2008
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Profiling complex surface structures using height scanning interfer...
- Publication number 20070097380
- Publication date May 3, 2007
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining optical properties using low-co...
- Publication number 20070086019
- Publication date Apr 19, 2007
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometry method and system including spectral decomposition
- Publication number 20070086013
- Publication date Apr 19, 2007
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer and method for measuring characteristics of opticall...
- Publication number 20070046953
- Publication date Mar 1, 2007
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for determining characteristics of an object surface...
- Publication number 20060158657
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Measurement of complex surface shapes using a spherical wavefront
- Publication number 20060114475
- Publication date Jun 1, 2006
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Transparent film measurements
- Publication number 20060012582
- Publication date Jan 19, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining optical properties using low-co...
- Publication number 20050259265
- Publication date Nov 24, 2005
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometric microscopy using reflective optics for complex surf...
- Publication number 20050134863
- Publication date Jun 23, 2005
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometry for thin film thickness and surface measure...
- Publication number 20050088663
- Publication date Apr 28, 2005
- Peter J. De Groot
- G02 - OPTICS
Information Patent Application
Profiling complex surface structures using scanning interferometry
- Publication number 20050073692
- Publication date Apr 7, 2005
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Triangulation methods and systems for profiling surfaces through a...
- Publication number 20050068540
- Publication date Mar 31, 2005
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Scanning interferometry
- Publication number 20040252310
- Publication date Dec 16, 2004
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Measurement of complex surface shapes using a spherical wavefront
- Publication number 20040239947
- Publication date Dec 2, 2004
- Zygo Corporation, a Delaware corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Profiling complex surface structures using scanning interferometry
- Publication number 20040189999
- Publication date Sep 30, 2004
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometric optical systems having simultaneously scanned optic...
- Publication number 20040027576
- Publication date Feb 12, 2004
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Characterization of period variations in diffraction gratings
- Publication number 20030128370
- Publication date Jul 10, 2003
- Xavier Colonna De Lega
- G02 - OPTICS
Information Patent Application
Measurement of complex surface shapes using a spherical wavefront
- Publication number 20030011784
- Publication date Jan 16, 2003
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Height scanning interferometer for determining the absolute positio...
- Publication number 20010050773
- Publication date Dec 13, 2001
- Peter De Groot
- G01 - MEASURING TESTING

Xavier Colonna De Lega

Person

Patents Grantslast 30 patents

Fiber-based interferometer system for monitoring an imaging interfe...

Interferometer for overlay measurements

Interferometer for determining overlay errors

Analyzing surface structure using scanning interferometry

Interferometer utilizing polarization scanning

Compound reference interferometer

Interferometer with multiple modes of operation for determining cha...

Interferometer and method for measuring characteristics of opticall...

Interferometry for lateral metrology

Interferometry for determining characteristics of an object surface...

Interferometer and method for measuring characteristics of opticall...

Interferometry method and system including spectral decomposition

Generating model signals for interferometry

Interferometer with multiple modes of operation for determining cha...

Profiling complex surface structures using scanning interferometry

Interferometer for determining characteristics of an object surface

Interferometer for determining characteristics of an object surface...

Scanning interferometry for thin film thickness and surface measure...

Interferometer and method for measuring characteristics of opticall...

Methods and systems for determining optical properties using low-co...

Triangulation methods and systems for profiling surfaces through a...

Low coherence grazing incidence interferometry for profiling and ti...

Profiling complex surface structures using scanning interferometry

Profiling complex surface structures using height scanning interfer...

Interferometric microscopy using reflective optics for complex surf...

Methods and systems for determining optical properties using low-co...

Measurement of complex surface shapes using a spherical wavefront

Profiling complex surface structures using scanning interferometry

Scanning interferometry

Interferometer having a coupled cavity geometry for use with an ext...

Patents Applicationslast 30 patents

INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...

INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...

FIBER-BASED INTERFEROMETER SYSTEM FOR MONITORING AN IMAGING INTERFE...

INTERFEROMETRIC SYSTEMS AND METHODS FEATURING SPECTRAL ANALYSIS OF...

ANALYZING SURFACE STRUCTURE USING SCANNING INTERFEROMETRY

INTERFEROMETER UTILIZING POLARIZATION SCANNING

GENERATING MODEL SIGNALS FOR INTERFEROMETRY

METHODS AND SYSTEMS FOR DETERMINING OPTICAL PROPERTIS USING LOW COH...

INTERFEROMETRY FOR LATERAL METROLOGY

INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...

PROFILING COMPLEX SURFACE STRUCTURES USING SCANNING INTERFEROMETRY

Profiling complex surface structures using height scanning interfer...

Methods and systems for determining optical properties using low-co...

Interferometry method and system including spectral decomposition

Interferometer and method for measuring characteristics of opticall...

Interferometer for determining characteristics of an object surface...

Measurement of complex surface shapes using a spherical wavefront

Transparent film measurements

Methods and systems for determining optical properties using low-co...

Interferometric microscopy using reflective optics for complex surf...

Scanning interferometry for thin film thickness and surface measure...

Profiling complex surface structures using scanning interferometry

Triangulation methods and systems for profiling surfaces through a...

Scanning interferometry

Measurement of complex surface shapes using a spherical wavefront

Profiling complex surface structures using scanning interferometry

Interferometric optical systems having simultaneously scanned optic...

Characterization of period variations in diffraction gratings

Measurement of complex surface shapes using a spherical wavefront

Height scanning interferometer for determining the absolute positio...