Xi-Cheng Zhang

Person

Latham, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Acoustic methods and systems for detecting terahertz radiation
- Patent number 9,110,022
- Issue date Aug 18, 2015
- Rensselaer Polytechnic Institute
- Benjamin Clough
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz radiation source mounting arrangements and methods of mou...
- Patent number 8,796,653
- Issue date Aug 5, 2014
- Rensselaer Polytechnic Institute
- Brian Schulkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma diagnostic method using terahertz-wave-enhanced fluorescence
- Patent number 8,674,304
- Issue date Mar 18, 2014
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting terahertz radiation by radiation...
- Patent number 8,653,462
- Issue date Feb 18, 2014
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz radiation anti-reflection devices and methods for handlin...
- Patent number 8,338,802
- Issue date Dec 25, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G02 - OPTICS
Information Patent Grant
Tunable broadband anti-relfection apparatus
- Patent number 8,299,435
- Issue date Oct 30, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G02 - OPTICS
Information Patent Grant
Method and system for plasma-induced terahertz spectroscopy
- Patent number 8,134,128
- Issue date Mar 13, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for handling terahertz radiation
- Patent number 7,808,636
- Issue date Oct 5, 2010
- Rensselaer Polytechnic Institute
- Brian Schulkin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating amplified terahertz radiation fo...
- Patent number 7,718,969
- Issue date May 18, 2010
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for plasma-induced terahertz spectroscopy
- Patent number 7,652,253
- Issue date Jan 26, 2010
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for the enhancement of terahertz wave generatio...
- Patent number 7,595,491
- Issue date Sep 29, 2009
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for imaging an object using multiple distinguisha...
- Patent number 7,557,348
- Issue date Jul 7, 2009
- Rensselaer Polytechnic Institute
- Jingzhou Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing a remotely-located object utilizing an optical...
- Patent number 7,531,802
- Issue date May 12, 2009
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Detection of biospecific interactions using amplified differential...
- Patent number 7,368,280
- Issue date May 6, 2008
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
GaSe crystals for broadband terahertz wave detection
- Patent number 7,242,010
- Issue date Jul 10, 2007
- Rensselaer Polytechnic Institute
- Kai Liu
- G01 - MEASURING TESTING
Information Patent Grant
High repetition rate, linear, true time optical delay line
- Patent number 7,239,775
- Issue date Jul 3, 2007
- Rensselaer Polytechnic Institute
- Jingzhou Xu
- G02 - OPTICS
Information Patent Grant
Field induced THz wave emission microscope
- Patent number 7,230,245
- Issue date Jun 12, 2007
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction mode terahertz tomography
- Patent number 7,129,491
- Issue date Oct 31, 2006
- Rensselaer Polytechnic Institute
- Bradley Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Transmission mode terahertz computed tomography
- Patent number 7,119,339
- Issue date Oct 10, 2006
- Rensselaer Polytechnic Institute
- Bradley Stuart Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor surface-field emitter for T-ray generation
- Patent number 7,091,506
- Issue date Aug 15, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Fresnel lens tomographic imaging
- Patent number 7,087,902
- Issue date Aug 8, 2006
- Rensselaer Polytechnic Institute
- Shaohong Wang
- G01 - MEASURING TESTING
Information Patent Grant
T-ray Microscope
- Patent number 6,977,379
- Issue date Dec 20, 2005
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz transceivers and methods for emission and detection of te...
- Patent number 6,844,552
- Issue date Jan 18, 2005
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast all-optical switch using carbon nanotube polymer composites
- Patent number 6,782,154
- Issue date Aug 24, 2004
- Rensselaer Polytechnic Institute
- Yiping Zhao
- G02 - OPTICS
Information Patent Grant
Terahertz imaging with dynamic aperture
- Patent number 6,734,974
- Issue date May 11, 2004
- Rensselaer Polytechnic Institute
- Zhiping Jiang
- G01 - MEASURING TESTING
Information Patent Grant
THz pulse measurement with an optical streak camera
- Patent number 6,690,001
- Issue date Feb 10, 2004
- Rensselaer Polytechnic Institute
- Zhiping Jiang
- G04 - HOROLOGY
Information Patent Grant
Method of characterizing free-space radiation using a chirped optic...
- Patent number 6,573,700
- Issue date Jun 3, 2003
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Differential time domain spectroscopy method for measuring thin fil...
- Patent number 6,556,306
- Issue date Apr 29, 2003
- Rensselaer Polytechnic Institute
- Zhiping Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic/magneto-optic measurement of electromagnetic radiatio...
- Patent number 6,414,473
- Issue date Jul 2, 2002
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical and magneto-optical sensing apparatus and method fo...
- Patent number 6,111,416
- Issue date Aug 29, 2000
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...
- Publication number 20140306128
- Publication date Oct 16, 2014
- Rensselaer Polytechnic Institute
- Brian SCHULKIN
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC METHODS AND SYSTEMS FOR DETECTING TERAHERTZ RADIATION
- Publication number 20130153790
- Publication date Jun 20, 2013
- Rensselaer Polytechnic Institute
- Benjamin Clough
- G01 - MEASURING TESTING
Information Patent Application
PLASMA DIAGNOSTIC METHOD USING TERAHERTZ-WAVE-ENHANCED FLUORESCENCE
- Publication number 20120193535
- Publication date Aug 2, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ RADIATION ANTI-REFLECTION DEVICES AND METHODS FOR HANDLIN...
- Publication number 20120049090
- Publication date Mar 1, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng ZHANG
- G02 - OPTICS
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING TERAHERTZ RADIATION BY RADIATION...
- Publication number 20110272584
- Publication date Nov 10, 2011
- Rensselaer Polytechnic Institute
- Xi-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
TUNABLE BROADBAND ANTI-RELFECTION APPARATUS
- Publication number 20110036984
- Publication date Feb 17, 2011
- Rensselaer Polytechnic Institute
- Xi-Cheng ZHANG
- G02 - OPTICS
Information Patent Application
TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...
- Publication number 20110006226
- Publication date Jan 13, 2011
- Rensselaer Polytechnic Institute
- Brian SCHULKIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY
- Publication number 20100277718
- Publication date Nov 4, 2010
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Compact Terahertz Spectrometer Using Optical Beam Recycling and Het...
- Publication number 20090066948
- Publication date Mar 12, 2009
- HYDROELECTRON VENTURES, INC.
- Nicholas Karpowicz
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR HANDLING TERAHERTZ RADIATION
- Publication number 20080239317
- Publication date Oct 2, 2008
- Rensselaer Polytechnic Institute
- Brian SCHULKIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY
- Publication number 20080203306
- Publication date Aug 28, 2008
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMAGING AN OBJECT USING MULTIPLE DISTINGUISHA...
- Publication number 20080179526
- Publication date Jul 31, 2008
- Rensselaer Polytechnic Institute
- Jingzhou XU
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING AMPLIFIED TERAHERTZ RADIATION FO...
- Publication number 20080048122
- Publication date Feb 28, 2008
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR THE ENHANCEMENT OF TERAHERTZ WAVE GENERATIO...
- Publication number 20070263682
- Publication date Nov 15, 2007
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A REMOTELY-LOCATED OBJECT UTILIZING AN OPTICAL...
- Publication number 20070145276
- Publication date Jun 28, 2007
- Rensselaer Polytechnic Institute
- XI-Cheng ZHANG
- G02 - OPTICS
Information Patent Application
High repetition rate, linear, true time optical delay line
- Publication number 20070009207
- Publication date Jan 11, 2007
- Jingzhou Xu
- G02 - OPTICS
Information Patent Application
GaSe crystals for broadband terahertz wave detection
- Publication number 20060214114
- Publication date Sep 28, 2006
- Kai Liu
- G01 - MEASURING TESTING
Information Patent Application
Detection of biospecific interactions using amplified differential...
- Publication number 20060045807
- Publication date Mar 2, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Application
Field induced THz wave emission microscope
- Publication number 20060022141
- Publication date Feb 2, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Application
Diffraction mode terahertz tomography
- Publication number 20050253071
- Publication date Nov 17, 2005
- Bradley Ferguson
- G01 - MEASURING TESTING
Information Patent Application
T-RAY MICROSCOPE
- Publication number 20050230625
- Publication date Oct 20, 2005
- Xi-Cheng Zhang
- G02 - OPTICS
Information Patent Application
Transmission mode terahertz computed tomography
- Publication number 20050023470
- Publication date Feb 3, 2005
- Bradley Ferguson
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor surface-field emitter for T-ray generation
- Publication number 20040262544
- Publication date Dec 30, 2004
- Xi-Cheng Zhang
- G02 - OPTICS
Information Patent Application
Fresnel lens tomographic imaging
- Publication number 20040010196
- Publication date Jan 15, 2004
- Shaohong Wang
- G02 - OPTICS
Information Patent Application
Method of characterizing free-space radiation using a chirped optic...
- Publication number 20030001558
- Publication date Jan 2, 2003
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Application
Ultrafast all-optical switch using carbon nanotube polymer composites
- Publication number 20020176650
- Publication date Nov 28, 2002
- Yiping Zhao
- G02 - OPTICS
Information Patent Application
Terahertz imaging with dynamic aperture
- Publication number 20020153874
- Publication date Oct 24, 2002
- Zhiping Jiang
- G01 - MEASURING TESTING
Information Patent Application
Differential time domain spectroscopy method for measuring thin fil...
- Publication number 20020118371
- Publication date Aug 29, 2002
- Rensselaer Polytechnic Institute
- Zhiping Jiang
- G01 - MEASURING TESTING
Information Patent Application
Pulse measurement with an optical streak camera
- Publication number 20010050334
- Publication date Dec 13, 2001
- Zhiping Jiang
- G04 - HOROLOGY

Xi-Cheng Zhang

Person

Patents Grantslast 30 patents

Acoustic methods and systems for detecting terahertz radiation

Terahertz radiation source mounting arrangements and methods of mou...

Plasma diagnostic method using terahertz-wave-enhanced fluorescence

Methods and systems for detecting terahertz radiation by radiation...

Terahertz radiation anti-reflection devices and methods for handlin...

Tunable broadband anti-relfection apparatus

Method and system for plasma-induced terahertz spectroscopy

Systems, methods, and devices for handling terahertz radiation

Methods and systems for generating amplified terahertz radiation fo...

Method and system for plasma-induced terahertz spectroscopy

Methods and systems for the enhancement of terahertz wave generatio...

Method and system for imaging an object using multiple distinguisha...

Method of analyzing a remotely-located object utilizing an optical...

Detection of biospecific interactions using amplified differential...

GaSe crystals for broadband terahertz wave detection

High repetition rate, linear, true time optical delay line

Field induced THz wave emission microscope

Diffraction mode terahertz tomography

Transmission mode terahertz computed tomography

Semiconductor surface-field emitter for T-ray generation

Fresnel lens tomographic imaging

T-ray Microscope

Terahertz transceivers and methods for emission and detection of te...

Ultrafast all-optical switch using carbon nanotube polymer composites

Terahertz imaging with dynamic aperture

THz pulse measurement with an optical streak camera

Method of characterizing free-space radiation using a chirped optic...

Differential time domain spectroscopy method for measuring thin fil...

Electro-optic/magneto-optic measurement of electromagnetic radiatio...

Electro-optical and magneto-optical sensing apparatus and method fo...

Patents Applicationslast 30 patents

TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...

ACOUSTIC METHODS AND SYSTEMS FOR DETECTING TERAHERTZ RADIATION

PLASMA DIAGNOSTIC METHOD USING TERAHERTZ-WAVE-ENHANCED FLUORESCENCE

TERAHERTZ RADIATION ANTI-REFLECTION DEVICES AND METHODS FOR HANDLIN...

METHODS AND SYSTEMS FOR DETECTING TERAHERTZ RADIATION BY RADIATION...

TUNABLE BROADBAND ANTI-RELFECTION APPARATUS

TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...

METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY

Compact Terahertz Spectrometer Using Optical Beam Recycling and Het...

SYSTEMS, METHODS, AND DEVICES FOR HANDLING TERAHERTZ RADIATION

METHOD AND SYSTEM FOR PLASMA-INDUCED TERAHERTZ SPECTROSCOPY

METHOD AND SYSTEM FOR IMAGING AN OBJECT USING MULTIPLE DISTINGUISHA...

METHODS AND SYSTEMS FOR GENERATING AMPLIFIED TERAHERTZ RADIATION FO...

METHODS AND SYSTEMS FOR THE ENHANCEMENT OF TERAHERTZ WAVE GENERATIO...

METHOD OF ANALYZING A REMOTELY-LOCATED OBJECT UTILIZING AN OPTICAL...

High repetition rate, linear, true time optical delay line

GaSe crystals for broadband terahertz wave detection

Detection of biospecific interactions using amplified differential...

Field induced THz wave emission microscope

Diffraction mode terahertz tomography

T-RAY MICROSCOPE

Transmission mode terahertz computed tomography

Semiconductor surface-field emitter for T-ray generation

Fresnel lens tomographic imaging

Method of characterizing free-space radiation using a chirped optic...

Ultrafast all-optical switch using carbon nanotube polymer composites

Terahertz imaging with dynamic aperture

Differential time domain spectroscopy method for measuring thin fil...

Pulse measurement with an optical streak camera