Xi Zhang

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Deriving a capacitance-ratio information, device and method
- Patent number 12,196,793
- Issue date Jan 14, 2025
- NXP B.V.
- Harish Kundur Subramaniyan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DERIVING A CAPACITANCE-RATIO INFORMATION, DEVICE AND METHOD
- Publication number 20230176103
- Publication date Jun 8, 2023
- NXP B.V.
- Harish Kundur Subramaniyan
- G01 - MEASURING TESTING