Xia Zhao

Follow

Person

Campbell, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Global shutter bulk charge modulated device
- Patent number 9,287,305
- Issue date Mar 15, 2016
- Semiconductor Components Industries, LLC
- Jaroslav Hynecek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Triple conversion gain image sensor pixels
- Patent number 9,247,170
- Issue date Jan 26, 2016
- Semiconductor Components Industries, LLC
- Hirofumi Komori
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Stacked pixels for high resolution CMOS image sensors with BCMD cha...
- Patent number 8,946,845
- Issue date Feb 3, 2015
- Aptina Imaging Corporation
- Jaroslav Hynecek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS image sensor with global shutter, rolling shutter, and a varia...
- Patent number 8,928,792
- Issue date Jan 6, 2015
- Aptina Imaging Corporation
- Jaroslav Hynecek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image sensor array for the back side illumination with junction gat...
- Patent number 8,618,459
- Issue date Dec 31, 2013
- Aptina Imaging Corporation
- Jaroslav Hynecek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CMOS IMAGE SENSOR WITH GLOBAL SHUTTER, ROLLING SHUTTER, AND A VARIA...
- Publication number 20150115332
- Publication date Apr 30, 2015
- Semiconductor Components Industries, LLC
- Jaroslav Hynecek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRIPLE CONVERSION GAIN IMAGE SENSOR PIXELS
- Publication number 20140078368
- Publication date Mar 20, 2014
- Aptina Imaging Corporation
- Hirofumi Komori
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE SENSOR ARRAY FOR THE BACK SIDE ILLUMINATION WITH JUNCTION GAT...
- Publication number 20120273653
- Publication date Nov 1, 2012
- APTINA IMAGING CORPORATION
- Jaroslav HYNECEK
- G01 - MEASURING TESTING