Xiang Fang

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Credible alliance blockchain digital calibration certificate system...
- Patent number 12,137,177
- Issue date Nov 5, 2024
- National Institute of Metrology, China
- Xiang Fang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for quantitative detection of gases
- Patent number 11,761,887
- Issue date Sep 19, 2023
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Zejian Huang
- G01 - MEASURING TESTING
Information Patent Grant
Flexible display panel and manufacturing method thereof
- Patent number 11,133,369
- Issue date Sep 28, 2021
- CHONGQING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Dehuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel, manufacturing method thereof, driving method and dis...
- Patent number 10,923,062
- Issue date Feb 16, 2021
- CHONGQING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Junhong Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry device and analysis method for gas phase molecule...
- Patent number 10,504,712
- Issue date Dec 10, 2019
- National Institute of Metrology, China
- You Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus for ultraviolet light ionization of neu...
- Patent number 10,163,618
- Issue date Dec 25, 2018
- NATIONAL INSTITUTE OF METROLOGY CHINA
- Xingchuang Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing ionic structure
- Patent number 9,716,001
- Issue date Jul 25, 2017
- BEIJING INSTITUTE OF TECHNOLOGY
- Wei Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Type rectangular ion trap device and method for ion storage and sep...
- Patent number 9,679,759
- Issue date Jun 13, 2017
- National Institute of Metrology, China
- Xingchuang Xiong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap-based apparatus and method for analyzing and detecting bip...
- Patent number 9,368,336
- Issue date Jun 14, 2016
- BEIJING INSTITUTE OF TECHNOLOGY
- Wei Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap, multiple electrode system and electrode for mass spectrom...
- Patent number 8,395,114
- Issue date Mar 12, 2013
- Xiang Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER SUPPLY CIRCUIT, DRIVING METHOD THEREOF, PRINTED CIRCUIT BOARD...
- Publication number 20240242656
- Publication date Jul 18, 2024
- CHONGQING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Ying Zhang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
TRUSTED SPACE POSITIONING CALIBRATION SERVICE SYSTEM AND OPERATION...
- Publication number 20240142634
- Publication date May 2, 2024
- National Institute of Metrology, China
- Xingchuang XIONG
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE MAGNETIC NANOMATERIAL BASED ON DNA TETRAHEDRON, PREPARATI...
- Publication number 20230333099
- Publication date Oct 19, 2023
- National Institute of Metrology,China
- Rui ZHAI
- G01 - MEASURING TESTING
Information Patent Application
ION STORAGE SYSTEM AND METHOD BASED ON QUADRUPOLE-ION TRAP TANDEM M...
- Publication number 20230094398
- Publication date Mar 30, 2023
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Shiying CHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREDIBLE ALLIANCE BLOCKCHAIN DIGITAL CALIBRATION CERTIFICATE SYSTEM...
- Publication number 20220393890
- Publication date Dec 8, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Xiang Fang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR QUANTITATIVE DETECTION OF GASES
- Publication number 20220307972
- Publication date Sep 29, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Zejian HUANG
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE DISPLAY PANEL AND MANUFACTURING METHOD THEREOF
- Publication number 20200328267
- Publication date Oct 15, 2020
- CHONGQING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Dehuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY PANEL, MANUFACTURING METHOD THEREOF, DRIVING METHOD AND DIS...
- Publication number 20200074951
- Publication date Mar 5, 2020
- CHONGQING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Junhong LU
- G02 - OPTICS
Information Patent Application
MASS SPECTROMETRY APPARATUS FOR ULTRAVIOLET LIGHT IONIZATION OF NEU...
- Publication number 20180261443
- Publication date Sep 13, 2018
- NATIONAL INSTITUTE OF METROLOGY CHINA
- Xingchuang XIONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Device and Analysis Method for Gas Phase Molecule...
- Publication number 20180108523
- Publication date Apr 19, 2018
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- You JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NETWORKING MASS ANALYSIS METHOD AND DEVICE
- Publication number 20170271137
- Publication date Sep 21, 2017
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- You JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEW TYPE RECTANGULAR ION TRAP DEVICE AND METHOD FOR ION STORAGE AND...
- Publication number 20160293396
- Publication date Oct 6, 2016
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Xingchuang XIONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE SYSTEM FOR ATMOSPHERIC PRESSURE INTERFACE, AND MASS SPEC...
- Publication number 20160268115
- Publication date Sep 15, 2016
- Beijing Institute of Technology
- Wei XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING IONIC STRUCTURE
- Publication number 20160247670
- Publication date Aug 25, 2016
- BEIJING INSTITUTE OF TECHNOLOGY
- WEI XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR ANALYZING ION STRUCTURE
- Publication number 20150262801
- Publication date Sep 17, 2015
- Beijing Institute of Technology
- Wei XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP-BASED APPARATUS AND METHOD FOR ANALYZING AND DETECTING BIP...
- Publication number 20150255265
- Publication date Sep 10, 2015
- Beijing Institute of Technology
- Wei Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap, multiple electrode system and electrode for mass spectrom...
- Publication number 20090321624
- Publication date Dec 31, 2009
- Xiang Fang
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Credible alliance blockchain digital calibration certificate system...

Apparatus and method for quantitative detection of gases

Flexible display panel and manufacturing method thereof

Display panel, manufacturing method thereof, driving method and dis...

Mass spectrometry device and analysis method for gas phase molecule...

Mass spectrometry apparatus for ultraviolet light ionization of neu...

Method for analyzing ionic structure

Type rectangular ion trap device and method for ion storage and sep...

Ion trap-based apparatus and method for analyzing and detecting bip...

Ion trap, multiple electrode system and electrode for mass spectrom...

Patents Applicationslast 30 patents

POWER SUPPLY CIRCUIT, DRIVING METHOD THEREOF, PRINTED CIRCUIT BOARD...

TRUSTED SPACE POSITIONING CALIBRATION SERVICE SYSTEM AND OPERATION...

COMPOSITE MAGNETIC NANOMATERIAL BASED ON DNA TETRAHEDRON, PREPARATI...

ION STORAGE SYSTEM AND METHOD BASED ON QUADRUPOLE-ION TRAP TANDEM M...

CREDIBLE ALLIANCE BLOCKCHAIN DIGITAL CALIBRATION CERTIFICATE SYSTEM...

APPARATUS AND METHOD FOR QUANTITATIVE DETECTION OF GASES

FLEXIBLE DISPLAY PANEL AND MANUFACTURING METHOD THEREOF

DISPLAY PANEL, MANUFACTURING METHOD THEREOF, DRIVING METHOD AND DIS...

MASS SPECTROMETRY APPARATUS FOR ULTRAVIOLET LIGHT IONIZATION OF NEU...

Mass Spectrometry Device and Analysis Method for Gas Phase Molecule...

NETWORKING MASS ANALYSIS METHOD AND DEVICE

NEW TYPE RECTANGULAR ION TRAP DEVICE AND METHOD FOR ION STORAGE AND...

ION SOURCE SYSTEM FOR ATMOSPHERIC PRESSURE INTERFACE, AND MASS SPEC...

METHOD FOR ANALYZING IONIC STRUCTURE

METHOD AND DEVICE FOR ANALYZING ION STRUCTURE

ION TRAP-BASED APPARATUS AND METHOD FOR ANALYZING AND DETECTING BIP...

Ion trap, multiple electrode system and electrode for mass spectrom...