Xiang Wei

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Enhanced full range optical coherence tomography
- Patent number 12,146,792
- Issue date Nov 19, 2024
- Topcon Corporation
- Xiang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced full range optical coherence tomography
- Patent number 11,846,546
- Issue date Dec 19, 2023
- Topcon Corporation
- Xiang Wei
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OCT SPECKLE VELOCIMETRY
- Publication number 20250185908
- Publication date Jun 12, 2025
- TOPCON CORPORATION
- Tony KO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED FULL RANGE OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240142307
- Publication date May 2, 2024
- TOPCON CORPORATION
- Xiang WEI
- G01 - MEASURING TESTING