Xiang Yuan

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Noise floor independent delay-locked loop discriminator
- Patent number 7,995,683
- Issue date Aug 9, 2011
- SiRF Technology Inc.
- Xiang Yuan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Time-to-first-fix for position determination
- Patent number 7,786,932
- Issue date Aug 31, 2010
- SiRF Technology, Inc.
- Qutub Salman Syed
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for frequency discriminator and data demodulat...
- Patent number 7,702,040
- Issue date Apr 20, 2010
- SiRF Technology, Inc.
- Xiang Yuan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for a space-efficient GPS receiver
- Patent number 7,355,551
- Issue date Apr 8, 2008
- SiRF Technology, Inc.
- Gang Xie
- G01 - MEASURING TESTING
Information Patent Grant
Frequency error tracking in satellite positioning system receivers
- Patent number 7,061,425
- Issue date Jun 13, 2006
- Motorola Inc.
- George J. Geier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Noise Floor Independent Delay-Locked Loop Discriminator
- Publication number 20090110134
- Publication date Apr 30, 2009
- Xiang Yuan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR A SPACE-EFFICIENT GPS RECEIVER
- Publication number 20090002231
- Publication date Jan 1, 2009
- Gang Xie
- G01 - MEASURING TESTING
Information Patent Application
TIME-TO-FIRST-FIX FOR POSITION DETERMINATION
- Publication number 20080231508
- Publication date Sep 25, 2008
- Qutub Salman Syed
- G01 - MEASURING TESTING
Information Patent Application
Method for a space-efficient GPS receiver
- Publication number 20070205942
- Publication date Sep 6, 2007
- SiRF Technology, Inc.
- Gang Xie
- G01 - MEASURING TESTING
Information Patent Application
Frequency error tracking in satellite positioning system receivers
- Publication number 20060103573
- Publication date May 18, 2006
- George J. Geier
- G01 - MEASURING TESTING