Xiangdong Don Li

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Union City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for feature alignment
- Patent number 8,728,309
- Issue date May 20, 2014
- Agilent Technologies, Inc.
- Xiangdong Don Li
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectral analysis of complex samples containing large molecules
- Patent number 8,237,108
- Issue date Aug 7, 2012
- Agilent Technologies, Inc.
- David M Horn
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectral analysis of complex samples containing large molecules
- Patent number 7,910,877
- Issue date Mar 22, 2011
- Agilent Technologies, Inc.
- David M Horn
- G01 - MEASURING TESTING
Information Patent Grant
Feature selection in mass spectral data
- Patent number 7,653,496
- Issue date Jan 26, 2010
- Agilent Technologies, Inc.
- Xiangdong Don Li
- G01 - MEASURING TESTING
Information Patent Grant
System and method for feature alignment
- Patent number 7,635,433
- Issue date Dec 22, 2009
- Agilent Technologies, Inc.
- Xiangdong Don Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CURATING MASS SPECTRAL LIBRARIES
- Publication number 20120108448
- Publication date May 3, 2012
- AGILENT TECHNOLOGIES, INC.
- Frank E. Kuhlmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTRAL ANALYSIS OF COMPLEX SAMPLES CONTAINING LARGE MOLECULES
- Publication number 20110198491
- Publication date Aug 18, 2011
- David M. Horn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass Spectral Analysis Of Complex Samples Containing Large Molecules
- Publication number 20100108876
- Publication date May 6, 2010
- David M. Horn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Feature Alignment
- Publication number 20100057377
- Publication date Mar 4, 2010
- AGILENT TECHNOLOGIES, INC.
- Xiangdong Don Li
- G01 - MEASURING TESTING
Information Patent Application
FEATURE SELECTION IN MASS SPECTRAL DATA
- Publication number 20070176088
- Publication date Aug 2, 2007
- Xiangdong Don Li
- G01 - MEASURING TESTING
Information Patent Application
System and method for feature allignment
- Publication number 20070045190
- Publication date Mar 1, 2007
- Xiangdong Don Li
- G01 - MEASURING TESTING