Xiangdong Pan

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Techniques providing fiducial markers for failure analysis
- Patent number 8,420,410
- Issue date Apr 16, 2013
- QUALCOMM Incorporated
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodologies and tool set for IDDQ verification, debugging and fai...
- Patent number 8,159,255
- Issue date Apr 17, 2012
- Qualcomm, Incorporated
- Michael Laisne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES PROVIDING FIDUCIAL MARKERS FOR FAILURE ANALYSIS
- Publication number 20110164808
- Publication date Jul 7, 2011
- QUALCOMM Incorporated
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGIES AND TOOL SET FOR IDDQ VERIFICATION, DEBUGGING AND FAI...
- Publication number 20090206868
- Publication date Aug 20, 2009
- QUALCOMM Incorporated
- Michael Laisne
- G01 - MEASURING TESTING