Xianghong Tong

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of forming secured metal gate antifuse structures
- Patent number 9,123,724
- Issue date Sep 1, 2015
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming secured metal gate antifuse structures
- Patent number 8,618,613
- Issue date Dec 31, 2013
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tamper resistant fuse design
- Patent number 8,242,831
- Issue date Aug 14, 2012
- Intel Corporation
- Xianghong Tong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
- Publication number 20240219460
- Publication date Jul 4, 2024
- Xianghong TONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...
- Publication number 20240219452
- Publication date Jul 4, 2024
- Intel Corporation
- Prasoon JOSHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING A SEMICONDUCTOR DEVICE USING X-RAYS
- Publication number 20240103072
- Publication date Mar 28, 2024
- Intel Corporation
- Patrick PARDY
- G01 - MEASURING TESTING
Information Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
- Publication number 20230317408
- Publication date Oct 5, 2023
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL ELECTRON BEAM PROBER
- Publication number 20230305057
- Publication date Sep 28, 2023
- Intel Corporation
- Xianghong Tong
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF FORMING SECURED METAL GATE ANTIFUSE STRUCTURES
- Publication number 20140103448
- Publication date Apr 17, 2014
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING SECURED METAL GATE ANTIFUSE STRUCTURES
- Publication number 20120248546
- Publication date Oct 4, 2012
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TAMPER RESISTANT FUSE DESIGN
- Publication number 20110156801
- Publication date Jun 30, 2011
- Xianghong Tong
- G11 - INFORMATION STORAGE

Xianghong Tong

Person

Patents Grantslast 30 patents

Methods of forming secured metal gate antifuse structures

Methods of forming secured metal gate antifuse structures

Tamper resistant fuse design

Patents Applicationslast 30 patents

ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...

METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...

TESTING A SEMICONDUCTOR DEVICE USING X-RAYS

STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING

WAFER LEVEL ELECTRON BEAM PROBER

METHODS OF FORMING SECURED METAL GATE ANTIFUSE STRUCTURES

METHODS OF FORMING SECURED METAL GATE ANTIFUSE STRUCTURES

TAMPER RESISTANT FUSE DESIGN