Xianghua Liu

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Resistivity probes with curved portions
- Patent number 11,249,110
- Issue date Feb 15, 2022
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic determination of metal film thickness from sheet resistance...
- Patent number 10,663,279
- Issue date May 26, 2020
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic determination of metal film thickness from sheet resistance...
- Patent number 10,598,477
- Issue date Mar 24, 2020
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Resistivity probe having movable needle bodies
- Patent number 10,514,391
- Issue date Dec 24, 2019
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Variable spacing four-point probe pin device and method
- Patent number 9,435,826
- Issue date Sep 6, 2016
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-Pin Dense Array Resistivity Probe
- Publication number 20200072869
- Publication date Mar 5, 2020
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Multi-Pin Dense Array Resistivity Probe
- Publication number 20180052189
- Publication date Feb 22, 2018
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Determination of Metal Film Thickness from Sheet Resistance...
- Publication number 20170227347
- Publication date Aug 10, 2017
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Determination of Metal Film Thickness from Sheet Resistance...
- Publication number 20170227348
- Publication date Aug 10, 2017
- KLA-Tencor Corporation
- Xianghua Liu
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD
- Publication number 20130300445
- Publication date Nov 14, 2013
- Walter H. Johnson
- G01 - MEASURING TESTING