Xiangyu WANG

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Hefei City, CN

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing structure and method for forming same
- Patent number 11,984,370
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiangyu Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR LAYOUT STRUCTURE AND SEMICONDUCTOR TEST STRUCTURE
- Publication number 20230326811
- Publication date Oct 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xiangyu WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20230268180
- Publication date Aug 24, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xiangyu WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20230268238
- Publication date Aug 24, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiangyu WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MEMORY
- Publication number 20230016209
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xiangyu WANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR TESTING STRUCTURE AND METHOD FOR FORMING SAME
- Publication number 20230008265
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Xiangyu WANG
- H01 - BASIC ELECTRIC ELEMENTS