Xianhuai ZHU

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Sugar Land, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Critical reflection illuminations analysis
- Patent number 9,075,161
- Issue date Jul 7, 2015
- ConocoPhillips Company
- Jun Cao
- G01 - MEASURING TESTING
Information Patent Grant
Converted-wave analysis system and method
- Patent number 6,212,477
- Issue date Apr 3, 2001
- PGS Tensor, Inc.
- Xianhuai Zhu
- G01 - MEASURING TESTING
Information Patent Grant
High fidelity rotation method and system
- Patent number 6,182,015
- Issue date Jan 30, 2001
- PGS Tensor, Inc.
- Suat Altan
- G01 - MEASURING TESTING
Information Patent Grant
Method of and system for processing multicomponent seismic data
- Patent number 6,061,298
- Issue date May 9, 2000
- PGS Tensor, Inc.
- Eric Madtson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRITICAL REFLECTION ILLUMINATIONS ANALYSIS
- Publication number 20130155814
- Publication date Jun 20, 2013
- ConocoPhillips Company
- Jun CAO
- G01 - MEASURING TESTING