Xiankun Jin

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Testing of on-chip analog-mixed signal circuits using on-chip memory
- Patent number 11,961,577
- Issue date Apr 16, 2024
- NXP USA, INC.
- Kumar Abhishek
- G11 - INFORMATION STORAGE
Information Patent Grant
Compensated alternating polarity capacitive structures
- Patent number 11,728,336
- Issue date Aug 15, 2023
- NXP USA, INC.
- Robert S. Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses involving calibration of input offset voltage and signa...
- Patent number 11,585,849
- Issue date Feb 21, 2023
- NXP USA, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for detecting faults in an analog input/output...
- Patent number 11,561,255
- Issue date Jan 24, 2023
- NXP USA, INC.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter (ADC) testing
- Patent number 11,489,535
- Issue date Nov 1, 2022
- NXP B.V.
- Xiankun Jin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Bootstrapped switch
- Patent number 11,418,188
- Issue date Aug 16, 2022
- NXP B.V.
- Kushagra Bhatheja
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-test-bus apparatuses involving calibration of comparator cir...
- Patent number 10,866,277
- Issue date Dec 15, 2020
- NXP B.V.
- Jan-Peter Schat
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Self-test apparatuses having distributed self-test controller circu...
- Patent number 10,816,595
- Issue date Oct 27, 2020
- NXP USA, INC.
- Xiankun Jin
- G01 - MEASURING TESTING
Information Patent Grant
Compensated alternating polarity capacitive structures
- Patent number 10,770,457
- Issue date Sep 8, 2020
- NXP USA, INC.
- Robert S. Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic comparator
- Patent number 10,505,519
- Issue date Dec 10, 2019
- NXP USA, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in self test for A/D converter
- Patent number 10,474,553
- Issue date Nov 12, 2019
- NXP USA, INC.
- Xiankun Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-intrusive on-chip analog test/trim/calibrate subsystem
- Patent number 10,359,469
- Issue date Jul 23, 2019
- NXP USA, INC.
- Xiankun Jin
- G01 - MEASURING TESTING
Information Patent Grant
Current source with variable resistor circuit
- Patent number 10,345,841
- Issue date Jul 9, 2019
- NXP USA, INC.
- Robert S. Jones
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for testing analog-to-digital converter and system therefor
- Patent number 9,473,164
- Issue date Oct 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for testing differential analog-to-digital converter and sys...
- Patent number 9,438,262
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Ramp voltage generator and method for testing an analog-to-digital...
- Patent number 9,319,033
- Issue date Apr 19, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Xiankun Jin
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
LAYERED ARCHITECTURE FOR MANAGING HEALTH OF AN ELECTRONIC SYSTEM AN...
- Publication number 20240020186
- Publication date Jan 18, 2024
- NXP B.V.
- Xiankun Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING OF ON-CHIP ANALOG-MIXED SIGNAL CIRCUITS USING ON-CHIP MEMORY
- Publication number 20240013848
- Publication date Jan 11, 2024
- NXP USA, Inc.
- Kumar Abhishek
- G11 - INFORMATION STORAGE
Information Patent Application
ANALOG-TO-DIGITAL CONVERTER (ADC) TESTING
- Publication number 20220368338
- Publication date Nov 17, 2022
- NXP B.V.
- Xiankun Jin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT...
- Publication number 20220334176
- Publication date Oct 20, 2022
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUSES INVOLVING CALIBRATION OF INPUT OFFSET VOLTAGE AND SIGNA...
- Publication number 20210003633
- Publication date Jan 7, 2021
- NXP USA, Inc.
- Tao Chen
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATED ALTERNATING POLARITY CAPACITIVE STRUCTURES
- Publication number 20200357794
- Publication date Nov 12, 2020
- NXP USA, Inc.
- Robert S. JONES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPENSATED ALTERNATING POLARITY CAPACITIVE STRUCTURES
- Publication number 20200144253
- Publication date May 7, 2020
- NXP USA, Inc.
- Robert S. JONES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-TEST APPARATUSES INVOLVING DISTRIBUTED SELF-TEST CONTROLLER CI...
- Publication number 20200124662
- Publication date Apr 23, 2020
- NXP USA, Inc.
- Xiankun Jin
- G01 - MEASURING TESTING
Information Patent Application
ANALOG-TEST-BUS APPARATUSES INVOLVING CALIBRATION OF COMPARATOR CIR...
- Publication number 20200072900
- Publication date Mar 5, 2020
- NXP B.V.
- Jan-Peter Schat
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Non-Intrusive On-Chip Analog Test/Trim/Calibrate Subsystem
- Publication number 20190178938
- Publication date Jun 13, 2019
- NXP USA, Inc.
- Xiankun Jin
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF TEST FOR A/D CONVERTER
- Publication number 20190026205
- Publication date Jan 24, 2019
- NXP USA, Inc.
- Xiankun Jin
- G06 - COMPUTING CALCULATING COUNTING

Xiankun Jin

Person

Patents Grantslast 30 patents

Testing of on-chip analog-mixed signal circuits using on-chip memory

Compensated alternating polarity capacitive structures

Apparatuses involving calibration of input offset voltage and signa...

Systems and methods for detecting faults in an analog input/output...

Analog-to-digital converter (ADC) testing

Bootstrapped switch

Analog-test-bus apparatuses involving calibration of comparator cir...

Self-test apparatuses having distributed self-test controller circu...

Compensated alternating polarity capacitive structures

Dynamic comparator

Built-in self test for A/D converter

Non-intrusive on-chip analog test/trim/calibrate subsystem

Current source with variable resistor circuit

Method for testing analog-to-digital converter and system therefor

Method for testing differential analog-to-digital converter and sys...

Ramp voltage generator and method for testing an analog-to-digital...

Patents Applicationslast 30 patents

LAYERED ARCHITECTURE FOR MANAGING HEALTH OF AN ELECTRONIC SYSTEM AN...

TESTING OF ON-CHIP ANALOG-MIXED SIGNAL CIRCUITS USING ON-CHIP MEMORY

ANALOG-TO-DIGITAL CONVERTER (ADC) TESTING

SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT...

APPARATUSES INVOLVING CALIBRATION OF INPUT OFFSET VOLTAGE AND SIGNA...

COMPENSATED ALTERNATING POLARITY CAPACITIVE STRUCTURES

COMPENSATED ALTERNATING POLARITY CAPACITIVE STRUCTURES

SELF-TEST APPARATUSES INVOLVING DISTRIBUTED SELF-TEST CONTROLLER CI...

ANALOG-TEST-BUS APPARATUSES INVOLVING CALIBRATION OF COMPARATOR CIR...

Non-Intrusive On-Chip Analog Test/Trim/Calibrate Subsystem

BUILT-IN SELF TEST FOR A/D CONVERTER