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Patents Grantslast 30 patents

Information Patent Grant
System for precision displacement measurement based on self-traceab...
- Patent number 11,802,758
- Issue date Oct 31, 2023
- Tongji University
- Xiao Deng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
- Publication number 20240151666
- Publication date May 9, 2024
- Shanghai Institute of Measurement and Testing Technology
- Lihua LEI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR PRECISION DISPLACEMENT MEASUREMENT BASED ON SELF-TRACEAB...
- Publication number 20230042098
- Publication date Feb 9, 2023
- Tongji University
- Xiao DENG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING GRATING REFERENCE MATERIALS HAVING A SELF-...
- Publication number 20210397081
- Publication date Dec 23, 2021
- Tongji University
- Xinbin CHENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY