Xiao-Jie Yuan

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterizing circuit performance by separating device and interco...
- Patent number 7,724,016
- Issue date May 25, 2010
- Xilinx, Inc.
- Xiao-Jie Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing circuit performance by separating device and interco...
- Patent number 7,489,152
- Issue date Feb 10, 2009
- Xilinx, Inc.
- Xiao-Jie Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing circuit performance by separating device and interco...
- Patent number 7,109,734
- Issue date Sep 19, 2006
- Xilinx, Inc.
- Xiao-Jie Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Layout correction algorithms for removing stress and other physical...
- Patent number 7,032,194
- Issue date Apr 18, 2006
- Xilinx, Inc.
- Shih-Cheng Hsueh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZING CIRCUIT PERFORMANCE BY SEPARATING DEVICE AND INTERCO...
- Publication number 20090121737
- Publication date May 14, 2009
- Xilinx, Inc.
- Xiao-Jie Yuan
- G01 - MEASURING TESTING
Information Patent Application
Characterizing circuit performance by separating device and interco...
- Publication number 20060267618
- Publication date Nov 30, 2006
- Xilinx, Inc.
- Xiao-Jie Yuan
- G01 - MEASURING TESTING
Information Patent Application
Characterizing circuit performance by separating device and interco...
- Publication number 20050149777
- Publication date Jul 7, 2005
- Xilinx, Inc.
- Xiao-Jie Yuan
- G01 - MEASURING TESTING