Xiao QIANG

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Patents Grantslast 30 patents

Information Patent Grant
Multifunction faucet
- Patent number 12,258,741
- Issue date Mar 25, 2025
- Shanghai Kohler Electronics Ltd.
- Xiaojun Zhou
- E03 - WATER SUPPLY SEWERAGE
Information Patent Grant
Multifunction faucet
- Patent number 11,396,741
- Issue date Jul 26, 2022
- Shanghai Kohler Electronics Ltd.
- Xiaojun Zhou
- E03 - WATER SUPPLY SEWERAGE
Information Patent Grant
Multifunction faucet
- Patent number 10,907,330
- Issue date Feb 2, 2021
- Shanghai Kohler Electronics Ltd.
- Xiaojun Zhou
- E03 - WATER SUPPLY SEWERAGE
Information Patent Grant
Reed switch with communication function which used for urinal
- Patent number 10,020,806
- Issue date Jul 10, 2018
- Shanghai Kohler Electronics, Ltd.
- Xiao Qiang
- E03 - WATER SUPPLY SEWERAGE
Information Patent Grant
Method and system for monitoring implantation of ions into semicond...
- Patent number 6,844,208
- Issue date Jan 18, 2005
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jin Ming Su
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIFUNCTION FAUCET
- Publication number 20220356686
- Publication date Nov 10, 2022
- Shanghai Kohler Electronics Ltd.
- Xiaojun Zhou
- E03 - WATER SUPPLY SEWERAGE
Information Patent Application
MULTIFUNCTION FAUCET
- Publication number 20210148102
- Publication date May 20, 2021
- Shanghai Kohler Electronics Tech Co. Ltd.
- Xiaojun Zhou
- E03 - WATER SUPPLY SEWERAGE
Information Patent Application
MULTIFUNCTION FAUCET
- Publication number 20190323215
- Publication date Oct 24, 2019
- Shanghai Kohler Electronics, Ltd.
- Xiaojun Zhou
- E03 - WATER SUPPLY SEWERAGE
Information Patent Application
REED SWITCH WITH COMMUNICATION FUNCTION WHICH USED FOR URINAL
- Publication number 20170134023
- Publication date May 11, 2017
- Shanghai Kohler Electronics, Ltd.
- Xiao QIANG
- E03 - WATER SUPPLY SEWERAGE
Information Patent Application
METHOD AND SYSTEM FOR MONITORING IMPLANTATION OF IONS INTO SEMICOND...
- Publication number 20040253752
- Publication date Dec 16, 2004
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jin Ming Su
- G01 - MEASURING TESTING