Xiaodong Han

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring correlation between fatigue perform...
- Patent number 12,366,540
- Issue date Jul 22, 2025
- Beijing University of Technology
- Lihua Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method utilizing cold welding to prepare grain boundaries having di...
- Patent number 11,766,736
- Issue date Sep 26, 2023
- Beijing University of Technology
- Lihua Wang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Polarizer and display device
- Patent number 10,983,384
- Issue date Apr 20, 2021
- BOE Technology Group Co., Ltd.
- Shibiao Zeng
- G02 - OPTICS
Information Patent Grant
Menu-type design method for GEO satellite control system based on o...
- Patent number 10,696,426
- Issue date Jun 30, 2020
- CHINA ACADEMY OF SPACE TECHNOLOGY
- Zhicheng Zhou
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Double-tilt in-situ nanoindentation platform for transmission elect...
- Patent number 10,410,822
- Issue date Sep 10, 2019
- Beijing University of Technology
- Xiaodong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-tilt sample holder for transmission electron microscope
- Patent number 10,103,000
- Issue date Oct 16, 2018
- Beijing University of Technology
- Xiaodong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-tilt in-situ mechanical sample holder for TEM based on piezo...
- Patent number 10,103,001
- Issue date Oct 16, 2018
- Beijing University of Technology
- Xiaodong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double tilt transmission electron microscope sample holder for in-s...
- Patent number 8,569,714
- Issue date Oct 29, 2013
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for quantitative measurement of electromechanical properties...
- Patent number 8,302,494
- Issue date Nov 6, 2012
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring electromechanical properties and mi...
- Patent number 8,069,733
- Issue date Dec 6, 2011
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN-SITU MECHANICAL MICRO-ELECTRO-MECHANICAL DEVICE AND SYSTEM, AS W...
- Publication number 20250054725
- Publication date Feb 13, 2025
- BEIJING UNIVERSITY OF TECHNOLOGY
- Xiaodong HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORM...
- Publication number 20240035988
- Publication date Feb 1, 2024
- BEIJING UNIVERSITY OF TECHNOLOGY
- Lihua Wang
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD UTILIZING COLD WELDING TO PREPARE GRAIN BOUNDARIES HAVING DI...
- Publication number 20230039597
- Publication date Feb 9, 2023
- BEIJING UNIVERSITY OF TECHNOLOGY
- Lihua WANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
POLARIZER AND DISPLAY DEVICE
- Publication number 20200285101
- Publication date Sep 10, 2020
- BOE TECHNOLOGY GROUP CO., LTD.
- Shibiao ZENG
- G02 - OPTICS
Information Patent Application
MENU-TYPE DESIGN METHOD FOR GEO SATELLITE CONTROL SYSTEM BASED ON O...
- Publication number 20180281991
- Publication date Oct 4, 2018
- CHINA ACADEMY OF SPACE TECHNOLOGY
- Zhicheng ZHOU
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
A DOUBLE-TILT IN-SITU NANOINDENTATION PLATFORM FOR TRANSMISSION ELE...
- Publication number 20180053625
- Publication date Feb 22, 2018
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE-TILT IN-SITU MECHANICAL SAMPLE HOLDER FOR TEM BASED ON PIEZO...
- Publication number 20170301511
- Publication date Oct 19, 2017
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOUBLE-TILT SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20170301510
- Publication date Oct 19, 2017
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double Tilt Transmission Electron Microscope Sample Holder for In-S...
- Publication number 20130105706
- Publication date May 2, 2013
- BEIJING UNIVERSITY OF TECHNOLOGY
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR QUANTITATIVE MEASUREMENT OF ELECTROMECHANICAL PROPERTIES...
- Publication number 20110107472
- Publication date May 5, 2011
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING ELECTROMECHANICAL PROPERTIES AND MI...
- Publication number 20100154557
- Publication date Jun 24, 2010
- BEIJING UNIVERSITY OF TECHNOLOGY
- Xiaodong Han
- G01 - MEASURING TESTING

Xiaodong Han

Person

Patents Grantslast 30 patents

Device and method for measuring correlation between fatigue perform...

Method utilizing cold welding to prepare grain boundaries having di...

Polarizer and display device

Menu-type design method for GEO satellite control system based on o...

Double-tilt in-situ nanoindentation platform for transmission elect...

Double-tilt sample holder for transmission electron microscope

Double-tilt in-situ mechanical sample holder for TEM based on piezo...

Double tilt transmission electron microscope sample holder for in-s...

Sensor for quantitative measurement of electromechanical properties...

Device and method for measuring electromechanical properties and mi...

Patents Applicationslast 30 patents

IN-SITU MECHANICAL MICRO-ELECTRO-MECHANICAL DEVICE AND SYSTEM, AS W...

DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORM...

METHOD UTILIZING COLD WELDING TO PREPARE GRAIN BOUNDARIES HAVING DI...

POLARIZER AND DISPLAY DEVICE

MENU-TYPE DESIGN METHOD FOR GEO SATELLITE CONTROL SYSTEM BASED ON O...

A DOUBLE-TILT IN-SITU NANOINDENTATION PLATFORM FOR TRANSMISSION ELE...

DOUBLE-TILT IN-SITU MECHANICAL SAMPLE HOLDER FOR TEM BASED ON PIEZO...

DOUBLE-TILT SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE

Double Tilt Transmission Electron Microscope Sample Holder for In-S...

SENSOR FOR QUANTITATIVE MEASUREMENT OF ELECTROMECHANICAL PROPERTIES...

DEVICE AND METHOD FOR MEASURING ELECTROMECHANICAL PROPERTIES AND MI...