Xiaodong He

Follow

Person

Jiangsu, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test structure for MOSFET noise testing
- Patent number 9,685,386
- Issue date Jun 20, 2017
- CSME TECHNOLOGIES FAB1 CO., LTD.
- Xiaodong He
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIELECTRIC CAPACITOR
- Publication number 20180358390
- Publication date Dec 13, 2018
- CSMC TECHNOLOGIES FAB2 CO., LTD.
- Xinxin LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE DEVICE SIMULATION MODEL AND MODELING METHOD THEREFOR
- Publication number 20170011144
- Publication date Jan 12, 2017
- CSMC TECHNOLOGIES FAB1 CO., LTD.
- Yifeng HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Test Structure For Mosfet Noise Testing
- Publication number 20150221568
- Publication date Aug 6, 2015
- CSMC TECHNOLOGIES FAB1 CO., LTD.
- Xiaodong He
- H01 - BASIC ELECTRIC ELEMENTS