Xiaodong Zhuge

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Tilburg, NL

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Patents Grantslast 30 patents

Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 9,711,325
- Issue date Jul 18, 2017
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope providing depth-resolved imagery
- Patent number 8,704,176
- Issue date Apr 22, 2014
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE MICROSCOPE PROVIDING DEPTH-RESOLVED IMAGERY
- Publication number 20140312226
- Publication date Oct 23, 2014
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle Microscope Providing Depth-Resolved Imagery
- Publication number 20130228683
- Publication date Sep 5, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING