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Patents Grantslast 30 patents

Information Patent Grant
Four-quadrant interferometry system based on an integrated array wa...
- Patent number 12,140,425
- Issue date Nov 12, 2024
- National Institute of Metrology, China
- Xiaofei Diao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...
- Publication number 20230127285
- Publication date Apr 27, 2023
- National Institute of Metrology,China
- Xiaofei Diao
- G01 - MEASURING TESTING