Xiaohong Zhou

Person

Houston, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to reduce the effects of maxwell terms and oth...
- Patent number 6,528,998
- Issue date Mar 4, 2003
- GE Medical Systems Global Technology Co., LLC
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to reduce perturbation field effects in MR ima...
- Patent number 6,469,505
- Issue date Oct 22, 2002
- GE Medical Systems Global Technology Co., LLC
- Joseph K. Maier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing image artifacts caused by magnet...
- Patent number 6,380,738
- Issue date Apr 30, 2002
- GE Medical Systems Global Technology Company, LLC
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Fast spin echo phase correction for MRI system
- Patent number 6,369,568
- Issue date Apr 9, 2002
- GE Medical Systems Global Technology Company, LLC
- Jingfei Ma
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to compensate for image artifacts caused by ma...
- Patent number 6,329,821
- Issue date Dec 11, 2001
- GE Medical Systems Global Technology Company, LLC
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing diffusion weighted MR images
- Patent number 6,323,646
- Issue date Nov 27, 2001
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying errors in magnetic resonance i...
- Patent number 6,239,599
- Issue date May 29, 2001
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for acquiring spatially and spectrally selective MR images
- Patent number 6,175,236
- Issue date Jan 16, 2001
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method employing point source to determine motion induced errors in...
- Patent number 6,114,852
- Issue date Sep 5, 2000
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing translational motion artifacts in MR imaging
- Patent number 6,070,095
- Issue date May 30, 2000
- General Electric Company
- Graeme C. McKinnon
- G01 - MEASURING TESTING
Information Patent Grant
Correction of artifacts caused by maxwell terms in slice offset ech...
- Patent number 6,064,205
- Issue date May 16, 2000
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for correcting motion-induced errors in MR imaging
- Patent number 6,057,685
- Issue date May 2, 2000
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating an MRI system for residual magnetization
- Patent number 6,043,656
- Issue date Mar 28, 2000
- General Electric Company
- Jingfei Ma
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing Maxwell term artifacts in fast spin echo MR images
- Patent number 6,011,392
- Issue date Jan 4, 2000
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Correction of artifacts caused by Maxwell terms in slice offset ech...
- Patent number 5,923,168
- Issue date Jul 13, 1999
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Correction of axial image signal fall off caused by Maxwell terms
- Patent number 5,917,323
- Issue date Jun 29, 1999
- General Electric Company
- Yping Du
- G01 - MEASURING TESTING
Information Patent Grant
Correction of artifacts caused by Maxwell terms in MR echo-planar i...
- Patent number 5,869,965
- Issue date Feb 9, 1999
- General Electric Company
- Yiping Du
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method to reduce eddy current effects in diffusion-weighted echo pl...
- Patent number 5,864,233
- Issue date Jan 26, 1999
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring and compensating for spatially and temporally...
- Patent number 5,770,943
- Issue date Jun 23, 1998
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing an off-center image using an EPI pulse sequence
- Patent number 5,689,186
- Issue date Nov 18, 1997
- General Electric Company
- Joseph Kenneth Maier
- G01 - MEASURING TESTING
Information Patent Grant
Reduction of Nyquist ghost artifacts in oblique echo planar imaging
- Patent number 5,672,969
- Issue date Sep 30, 1997
- General Electric Company
- Xiaohong Zhou
- G01 - MEASURING TESTING

Xiaohong Zhou

Person

Patents Grantslast 30 patents

Method and apparatus to reduce the effects of maxwell terms and oth...

Method and apparatus to reduce perturbation field effects in MR ima...

Method and apparatus for reducing image artifacts caused by magnet...

Fast spin echo phase correction for MRI system

Method and apparatus to compensate for image artifacts caused by ma...

Method and apparatus for producing diffusion weighted MR images

Method and apparatus for identifying errors in magnetic resonance i...

Method for acquiring spatially and spectrally selective MR images

Method employing point source to determine motion induced errors in...

Method for reducing translational motion artifacts in MR imaging

Correction of artifacts caused by maxwell terms in slice offset ech...

Method for correcting motion-induced errors in MR imaging

Method for compensating an MRI system for residual magnetization

Method for reducing Maxwell term artifacts in fast spin echo MR images

Correction of artifacts caused by Maxwell terms in slice offset ech...

Correction of axial image signal fall off caused by Maxwell terms

Correction of artifacts caused by Maxwell terms in MR echo-planar i...

Method to reduce eddy current effects in diffusion-weighted echo pl...

Method for measuring and compensating for spatially and temporally...

Method for producing an off-center image using an EPI pulse sequence

Reduction of Nyquist ghost artifacts in oblique echo planar imaging