Xiaoji Xu

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Bethlehem, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 12,000,861
- Issue date Jun 4, 2024
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 11,415,597
- Issue date Aug 16, 2022
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Infrared characterization of a sample using oscillating mode
- Patent number 10,845,382
- Issue date Nov 24, 2020
- Chanmin Su
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20220390485
- Publication date Dec 8, 2022
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
System and Method for a Non-Tapping Mode Scattering-Type Scanning N...
- Publication number 20210041477
- Publication date Feb 11, 2021
- LEHIGH UNIVERSITY
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Application
Infrared Characterization of a Sample Using Oscillating Mode
- Publication number 20180052186
- Publication date Feb 22, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
SNOM SYSTEM WITH LASER-DRIVEN PLASMA SOURCE
- Publication number 20170067934
- Publication date Mar 9, 2017
- Xiaoji Xu
- G01 - MEASURING TESTING