Xiaoju Wu

Person

Irving, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Shallow trench isolation processing with local oxidation of silicon
- Patent number 12,199,091
- Issue date Jan 14, 2025
- Texas Instruments Incorporated
- Robert Martin Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit with isolated SCR for negative voltage opera...
- Patent number 12,057,443
- Issue date Aug 6, 2024
- Texas Instruments Incorporated
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High reliability polysilicon components
- Patent number 11,916,067
- Issue date Feb 27, 2024
- Texas Instruments Incorporated
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Protection of drain extended transistor field oxide
- Patent number 11,374,124
- Issue date Jun 28, 2022
- Texas Instruments Incorporated
- James Robert Todd
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit with isolated SCR for negative voltage opera...
- Patent number 11,302,688
- Issue date Apr 12, 2022
- Texas Instruments Incorporated
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High reliability polysilicon components
- Patent number 11,296,075
- Issue date Apr 5, 2022
- Texas Instruments Incorporated
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Drain extended transistor
- Patent number 11,152,505
- Issue date Oct 19, 2021
- Texas Instruments Incorporated
- Alexei Sadovnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain extended NMOS transistor
- Patent number 11,094,817
- Issue date Aug 17, 2021
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit with isolated SCR for negative voltage opera...
- Patent number 11,049,852
- Issue date Jun 29, 2021
- Texas Instruments Incorporated
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain centered LDMOS transistor with integrated dummy patterns
- Patent number 10,879,387
- Issue date Dec 29, 2020
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain extended NMOS transistor
- Patent number 10,580,890
- Issue date Mar 3, 2020
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
P-channel DEMOS device
- Patent number 10,505,037
- Issue date Dec 10, 2019
- Texas Instruments Incorporated
- Chin-Yu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Output driver with power down protection
- Patent number 10,498,326
- Issue date Dec 3, 2019
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drain centered LDMOS transistor with integrated dummy patterns
- Patent number 10,461,182
- Issue date Oct 29, 2019
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with extended electrically-safe operating area
- Patent number 10,347,732
- Issue date Jul 9, 2019
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with extended electrically-safe operating area
- Patent number 10,326,014
- Issue date Jun 18, 2019
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET transistors with robust subthreshold operations
- Patent number 10,090,299
- Issue date Oct 2, 2018
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit with isolated SCR for negative voltage opera...
- Patent number 10,083,951
- Issue date Sep 25, 2018
- Texas Instruments Incorporated
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with extended electrically-safe operating area
- Patent number 10,014,405
- Issue date Jul 3, 2018
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
P-channel DEMOS device
- Patent number 9,947,783
- Issue date Apr 17, 2018
- Texas Instruments Incorporated
- Chin-Yu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET transistors with robust subthreshold operations
- Patent number 9,899,376
- Issue date Feb 20, 2018
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit with isolated SCR for negative voltage opera...
- Patent number 9,099,523
- Issue date Aug 4, 2015
- Texas Instruments Incorporated
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Area-efficient electrically erasable programmable memory cell
- Patent number 8,581,324
- Issue date Nov 12, 2013
- Texas Instruments Incorporated
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Area-efficient electrically erasable programmable memory cell
- Patent number 8,125,830
- Issue date Feb 28, 2012
- Texas Instruments Incorporated
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for reducing gate dielectric thinning on trench isolation e...
- Patent number 8,114,744
- Issue date Feb 14, 2012
- Texas Instruments Incorporated
- Amitava Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single poly EEPROM without separate control gate nor erase regions
- Patent number 8,067,795
- Issue date Nov 29, 2011
- Texas Instruments Incorporated
- Jozef Czeslaw Mitros
- G11 - INFORMATION STORAGE
Information Patent Grant
Area-efficient electrically erasable programmable memory cell
- Patent number 7,919,368
- Issue date Apr 5, 2011
- Texas Instruments Incorporated
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatic gain control
- Patent number 7,893,768
- Issue date Feb 22, 2011
- Texas Instruments Incorporated
- Zhengyu Wang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method to detect poly residues in LOCOS process
- Patent number 7,785,906
- Issue date Aug 31, 2010
- Texas Instruments Incorporated
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Gate self aligned low noise JFET
- Patent number 7,745,274
- Issue date Jun 29, 2010
- Texas Instruments Incorporated
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SHALLOW TRENCH ISOLATION PROCESSING WITH LOCAL OXIDATION OF SILICON
- Publication number 20220367444
- Publication date Nov 17, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Robert Martin Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...
- Publication number 20220189946
- Publication date Jun 16, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RELIABILITY POLYSILICON COMPONENTS
- Publication number 20220189949
- Publication date Jun 16, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRAIN EXTENDED NMOS TRANSISTOR
- Publication number 20200161471
- Publication date May 21, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RELIABILITY POLYSILICON COMPONENTS
- Publication number 20200075583
- Publication date Mar 5, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRAIN CENTERED LDMOS TRANSISTOR WITH INTEGRATED DUMMY PATTERNS
- Publication number 20200013890
- Publication date Jan 9, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROTECTION OF DRAIN EXTENDED TRANSISTOR FIELD OXIDE
- Publication number 20200006550
- Publication date Jan 2, 2020
- TEXAS INSTRUMENTS INCORPORATED
- James Robert Todd
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRAIN EXTENDED TRANSISTOR
- Publication number 20200006549
- Publication date Jan 2, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Alexei Sadovnikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH EXTENDED ELECTRICALLY-SAFE OPERATING AREA
- Publication number 20190214471
- Publication date Jul 11, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRAIN EXTENDED NMOS TRANSISTOR
- Publication number 20190172946
- Publication date Jun 6, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...
- Publication number 20180350794
- Publication date Dec 6, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...
- Publication number 20180350795
- Publication date Dec 6, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH EXTENDED ELECTRICALLY-SAFE OPERATING AREA
- Publication number 20180269317
- Publication date Sep 20, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
P-CHANNEL DEMOS DEVICE
- Publication number 20180197986
- Publication date Jul 12, 2018
- TEXAS INSTRUMENTS INCORPORATED
- CHIN-YU TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH EXTENDED ELECTRICALLY-SAFE OPERATING AREA
- Publication number 20180190813
- Publication date Jul 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET TRANSISTORS WITH ROBUST SUBTHRESHOLD OPERATIONS
- Publication number 20180130798
- Publication date May 10, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
P-CHANNEL DEMOS DEVICE
- Publication number 20170309744
- Publication date Oct 26, 2017
- TEXAS INSTRUMENTS INCORPORATED
- CHIN-YU TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET Transistors with Robust Subthreshold Operations
- Publication number 20170256537
- Publication date Sep 7, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTPUT DRIVER WITH POWER DOWN PROTECTION
- Publication number 20170257088
- Publication date Sep 7, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...
- Publication number 20150294967
- Publication date Oct 15, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...
- Publication number 20140124828
- Publication date May 8, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Akram A. Salman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AREA-EFFICIENT ELECTRICALLY ERASABLE PROGRAMMABLE MEMORY CELL
- Publication number 20120074479
- Publication date Mar 29, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Application
AREA-EFFICIENT ELECTRICALLY ERASABLE PROGRAMMABLE MEMORY CELL
- Publication number 20110110160
- Publication date May 12, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Application
Area-Efficient Electrically Erasable Programmable Memory Cell
- Publication number 20100302854
- Publication date Dec 2, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- G11 - INFORMATION STORAGE
Information Patent Application
GATE SELF-ALIGNED LOW NOISE JFET
- Publication number 20100264466
- Publication date Oct 21, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Xiaoju Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC GAIN CONTROL
- Publication number 20100231299
- Publication date Sep 16, 2010
- Texas Instrument Incorporated
- Zhengyu Wang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS FOR REDUCING GATE DIELECTRIC THINNING ON TRENCH ISOLATION E...
- Publication number 20100164004
- Publication date Jul 1, 2010
- TEXAS INSTRUMENTS INCORPORATED
- AMITAVA CHATTERJEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMPLE AND EFFECTIVE METHOD TO DETECT POLY RESIDUES IN LOCOS PROCESS
- Publication number 20090153174
- Publication date Jun 18, 2009
- Xiaoju Wu
- G01 - MEASURING TESTING
Information Patent Application
High Density Capacitor Using Topographic Surface
- Publication number 20080283966
- Publication date Nov 20, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Shanjen Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BODY BIAS TO FACILITATE TRANSISTOR MATCHING
- Publication number 20080277731
- Publication date Nov 13, 2008
- Henry Litzmann Edwards
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Shallow trench isolation processing with local oxidation of silicon

ESD protection circuit with isolated SCR for negative voltage opera...

High reliability polysilicon components

Protection of drain extended transistor field oxide

ESD protection circuit with isolated SCR for negative voltage opera...

High reliability polysilicon components

Drain extended transistor

Drain extended NMOS transistor

ESD protection circuit with isolated SCR for negative voltage opera...

Drain centered LDMOS transistor with integrated dummy patterns

Drain extended NMOS transistor

P-channel DEMOS device

Output driver with power down protection

Drain centered LDMOS transistor with integrated dummy patterns

Semiconductor device with extended electrically-safe operating area

Semiconductor device with extended electrically-safe operating area

MOSFET transistors with robust subthreshold operations

ESD protection circuit with isolated SCR for negative voltage opera...

Semiconductor device with extended electrically-safe operating area

P-channel DEMOS device

MOSFET transistors with robust subthreshold operations

ESD protection circuit with isolated SCR for negative voltage opera...

Area-efficient electrically erasable programmable memory cell

Area-efficient electrically erasable programmable memory cell

Methods for reducing gate dielectric thinning on trench isolation e...

Single poly EEPROM without separate control gate nor erase regions

Area-efficient electrically erasable programmable memory cell

Automatic gain control

Method to detect poly residues in LOCOS process

Gate self aligned low noise JFET

Patents Applicationslast 30 patents

SHALLOW TRENCH ISOLATION PROCESSING WITH LOCAL OXIDATION OF SILICON

ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...

HIGH RELIABILITY POLYSILICON COMPONENTS

DRAIN EXTENDED NMOS TRANSISTOR

HIGH RELIABILITY POLYSILICON COMPONENTS

DRAIN CENTERED LDMOS TRANSISTOR WITH INTEGRATED DUMMY PATTERNS

PROTECTION OF DRAIN EXTENDED TRANSISTOR FIELD OXIDE

DRAIN EXTENDED TRANSISTOR

SEMICONDUCTOR DEVICE WITH EXTENDED ELECTRICALLY-SAFE OPERATING AREA

DRAIN EXTENDED NMOS TRANSISTOR

ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...

ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...

SEMICONDUCTOR DEVICE WITH EXTENDED ELECTRICALLY-SAFE OPERATING AREA

P-CHANNEL DEMOS DEVICE

SEMICONDUCTOR DEVICE WITH EXTENDED ELECTRICALLY-SAFE OPERATING AREA

MOSFET TRANSISTORS WITH ROBUST SUBTHRESHOLD OPERATIONS

P-CHANNEL DEMOS DEVICE

MOSFET Transistors with Robust Subthreshold Operations

OUTPUT DRIVER WITH POWER DOWN PROTECTION

ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...

ESD PROTECTION CIRCUIT WITH ISOLATED SCR FOR NEGATIVE VOLTAGE OPERA...

AREA-EFFICIENT ELECTRICALLY ERASABLE PROGRAMMABLE MEMORY CELL

AREA-EFFICIENT ELECTRICALLY ERASABLE PROGRAMMABLE MEMORY CELL

Area-Efficient Electrically Erasable Programmable Memory Cell

GATE SELF-ALIGNED LOW NOISE JFET

AUTOMATIC GAIN CONTROL

METHODS FOR REDUCING GATE DIELECTRIC THINNING ON TRENCH ISOLATION E...

SIMPLE AND EFFECTIVE METHOD TO DETECT POLY RESIDUES IN LOCOS PROCESS

High Density Capacitor Using Topographic Surface

BODY BIAS TO FACILITATE TRANSISTOR MATCHING