Xiaolan Zhang

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatuses for improved positioning in a probing system
- Patent number 7,852,097
- Issue date Dec 14, 2010
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for improved positioning in a probing system
- Patent number 7,368,929
- Issue date May 6, 2008
- Electroglas, Inc.
- Uday Nayak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUSES FOR IMPROVED POSITIONING IN A PROBING SYSTEM
- Publication number 20080150565
- Publication date Jun 26, 2008
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatuses for improved positioning in a probing system
- Publication number 20070164762
- Publication date Jul 19, 2007
- Uday Nayak
- G01 - MEASURING TESTING