Xiaolin ZHAO

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Sample collecting and introducing device and detection system
- Patent number 10,520,402
- Issue date Dec 31, 2019
- Qingjun Zhang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam intensity monitoring device and X-ray inspection
- Patent number 10,466,372
- Issue date Nov 5, 2019
- Tsinghua University
- Kejun Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detection apparatus and method, data processing method an...
- Patent number 10,338,236
- Issue date Jul 2, 2019
- Nuctech Company Limited
- Yuanjing Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE COLLECTING AND INTRODUCING DEVICE AND DETECTION SYSTEM
- Publication number 20190195751
- Publication date Jun 27, 2019
- TSINGHUA UNIVERSITY
- Qingjun ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION APPARATUS AND METHOD, DATA PROCESSING METHOD AN...
- Publication number 20180164449
- Publication date Jun 14, 2018
- Nuctech Company Limited
- Yuanjing Li
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM
- Publication number 20160187502
- Publication date Jun 30, 2016
- TSINGHUA UNIVERSITY
- Kejun KANG
- G01 - MEASURING TESTING